Kim, Hae Yong 
; Maruta, Ricardo Hitoshi; Huanca, Danilo Roque ; Salcedo, Walter Jaimes
Source: Journal of Porous Materials. Unidade: EP
Subjects: GRANULOMETRIA, NANOPARTÍCULAS
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ABNT
KIM, Hae Yong et al. Correlation-based multi-shape granulometry with application in porous silicon nanomaterial chacaracterization. Journal of Porous Materials, v. 20, p. 375-385, 2013Tradução . . Disponível em: https://doi.org/10.1007/s10934-012-9607-9. Acesso em: 05 nov. 2024.APA
Kim, H. Y., Maruta, R. H., Huanca, D. R., & Salcedo, W. J. (2013). Correlation-based multi-shape granulometry with application in porous silicon nanomaterial chacaracterization. Journal of Porous Materials, 20, 375-385. doi:10.1007/s10934-012-9607-9NLM
Kim HY, Maruta RH, Huanca DR, Salcedo WJ. Correlation-based multi-shape granulometry with application in porous silicon nanomaterial chacaracterization [Internet]. Journal of Porous Materials. 2013 ; 20 375-385.[citado 2024 nov. 05 ] Available from: https://doi.org/10.1007/s10934-012-9607-9Vancouver
Kim HY, Maruta RH, Huanca DR, Salcedo WJ. Correlation-based multi-shape granulometry with application in porous silicon nanomaterial chacaracterization [Internet]. Journal of Porous Materials. 2013 ; 20 375-385.[citado 2024 nov. 05 ] Available from: https://doi.org/10.1007/s10934-012-9607-9
