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Trabalho de evento
Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals (2010)
Pizani, P. S.; Duduch, Jaime Gilberto; Jasinevicius, Renato Goulart
Source: Conference Proceedings. Conference titles: Euspen International Conference. Unidade: EESC
Subjects: ESPECTROSCOPIA, ENGENHARIA MECÂNICA
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ABNT
PIZANI, P. S. e DUDUCH, Jaime Gilberto e JASINEVICIUS, Renato Goulart. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. 2010, Anais.. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2010. Disponível em: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf. Acesso em: 23 ago. 2024.
APA
Pizani, P. S., Duduch, J. G., & Jasinevicius, R. G. (2010). Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. In Conference Proceedings. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
NLM
Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
Vancouver
Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
Artigo de periodico
Study of phase transition in (Pb,Ba)Ti'OIND.3' thin films (2008)
Pontes, F. M.; Santos, L. S.; Pontes, D. S. L.; Longo, E.; Claro Neto, Salvador; Leite, E. R.; Chiquito, A. J.; Pizani, P. S.
Source: Journal of Applied Physics. Unidade: IQSC
Assunto: QUÍMICA ANALÍTICA
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ABNT
PONTES, F. M. et al. Study of phase transition in (Pb,Ba)Ti'OIND.3' thin films. Journal of Applied Physics, v. 104, n. 1, p. 014107-1, 2008Tradução . . Acesso em: 23 ago. 2024.
APA
Pontes, F. M., Santos, L. S., Pontes, D. S. L., Longo, E., Claro Neto, S., Leite, E. R., et al. (2008). Study of phase transition in (Pb,Ba)Ti'OIND.3' thin films. Journal of Applied Physics, 104( 1), 014107-1.
NLM
Pontes FM, Santos LS, Pontes DSL, Longo E, Claro Neto S, Leite ER, Chiquito AJ, Pizani PS. Study of phase transition in (Pb,Ba)Ti'OIND.3' thin films. Journal of Applied Physics. 2008 ; 104( 1): 014107-1.[citado 2024 ago. 23 ]
Vancouver
Pontes FM, Santos LS, Pontes DSL, Longo E, Claro Neto S, Leite ER, Chiquito AJ, Pizani PS. Study of phase transition in (Pb,Ba)Ti'OIND.3' thin films. Journal of Applied Physics. 2008 ; 104( 1): 014107-1.[citado 2024 ago. 23 ]
Artigo de periodico
Leakage current, ferroeletric and structural properties in 'Pb IND.1-x' 'Ba IND.x' 'Ti O IND.3" thin films prepared by chemical route (2008)
Pontes, F. M.; Santos, L. S.; Rissato, S.; Pontes, D. S. L.; Longo, E.; Leite, E. R.; Claro Neto, Salvador; Chiquito, A. J.; Pizani, P. S.
Source: Journal of Physics and Chemistry of Solids. Unidade: IQSC
Subjects: FILMES FINOS, QUÍMICA ANALÍTICA
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ABNT
PONTES, F. M. et al. Leakage current, ferroeletric and structural properties in 'Pb IND.1-x' 'Ba IND.x' 'Ti O IND.3" thin films prepared by chemical route. Journal of Physics and Chemistry of Solids, v. 69, n. 11, p. 2796-2803, 2008Tradução . . Acesso em: 23 ago. 2024.
APA
Pontes, F. M., Santos, L. S., Rissato, S., Pontes, D. S. L., Longo, E., Leite, E. R., et al. (2008). Leakage current, ferroeletric and structural properties in 'Pb IND.1-x' 'Ba IND.x' 'Ti O IND.3" thin films prepared by chemical route. Journal of Physics and Chemistry of Solids, 69( 11), 2796-2803.
NLM
Pontes FM, Santos LS, Rissato S, Pontes DSL, Longo E, Leite ER, Claro Neto S, Chiquito AJ, Pizani PS. Leakage current, ferroeletric and structural properties in 'Pb IND.1-x' 'Ba IND.x' 'Ti O IND.3" thin films prepared by chemical route. Journal of Physics and Chemistry of Solids. 2008 ; 69( 11): 2796-2803.[citado 2024 ago. 23 ]
Vancouver
Pontes FM, Santos LS, Rissato S, Pontes DSL, Longo E, Leite ER, Claro Neto S, Chiquito AJ, Pizani PS. Leakage current, ferroeletric and structural properties in 'Pb IND.1-x' 'Ba IND.x' 'Ti O IND.3" thin films prepared by chemical route. Journal of Physics and Chemistry of Solids. 2008 ; 69( 11): 2796-2803.[citado 2024 ago. 23 ]
Trabalho de evento
High pressure phase transformation in single crystal silicon during ductile regime diamond turning (2005)
Jasinevicius, Renato Goulart; Pizani, P. S.
Source: Proceedings of the COBEM 2005. Conference titles: International Congress of Mechanical Engineering. Unidade: EESC
Subjects: MUDANÇA DE FASE, DIAMANTE, FERRAMENTAS, ENGENHARIA MECÂNICA
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ABNT
JASINEVICIUS, Renato Goulart e PIZANI, P. S. High pressure phase transformation in single crystal silicon during ductile regime diamond turning. 2005, Anais.. Rio de Janeiro, RJ: ABCM, 2005. Disponível em: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf. Acesso em: 23 ago. 2024.
APA
Jasinevicius, R. G., & Pizani, P. S. (2005). High pressure phase transformation in single crystal silicon during ductile regime diamond turning. In Proceedings of the COBEM 2005. Rio de Janeiro, RJ: ABCM. Recuperado de http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
NLM
Jasinevicius RG, Pizani PS. High pressure phase transformation in single crystal silicon during ductile regime diamond turning [Internet]. Proceedings of the COBEM 2005. 2005 ;[citado 2024 ago. 23 ] Available from: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
Vancouver
Jasinevicius RG, Pizani PS. High pressure phase transformation in single crystal silicon during ductile regime diamond turning [Internet]. Proceedings of the COBEM 2005. 2005 ;[citado 2024 ago. 23 ] Available from: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
Trabalho de evento
Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman (2001)
Jasinevicius, Renato Goulart; Duduch, Jaime Gilberto; Pagotto, Carlos Renato; Pizani, P. S.
Conference titles: Congresso Brasileiro de Engenharia de Fabricação. Unidade: EESC
Subjects: FERRAMENTAS, MUDANÇA DE FASE, ENGENHARIA MECÂNICA
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ABNT
JASINEVICIUS, Renato Goulart et al. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001, Anais.. Curitiba: ABCM, 2001. . Acesso em: 23 ago. 2024.
APA
Jasinevicius, R. G., Duduch, J. G., Pagotto, C. R., & Pizani, P. S. (2001). Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. In . Curitiba: ABCM.
NLM
Jasinevicius RG, Duduch JG, Pagotto CR, Pizani PS. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001 ;[citado 2024 ago. 23 ]
Vancouver
Jasinevicius RG, Duduch JG, Pagotto CR, Pizani PS. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001 ;[citado 2024 ago. 23 ]
Artigo de periodico
Ductile and brittle modes in single-point-diamond-turning of silicon probed by Raman scattering (1999)
Pizani, P. S.; Jasinevicius, R.; Duduch, Jaime Gilberto; Porto, Arthur José Vieira
Source: Journal of Materials Science Letters. Unidade: EESC
Subjects: ENGENHARIA MECÂNICA, FERRAMENTAS
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ABNT
PIZANI, P. S. et al. Ductile and brittle modes in single-point-diamond-turning of silicon probed by Raman scattering. Journal of Materials Science Letters, v. 18, p. 1185-1187, 1999Tradução . . Acesso em: 23 ago. 2024.
APA
Pizani, P. S., Jasinevicius, R., Duduch, J. G., & Porto, A. J. V. (1999). Ductile and brittle modes in single-point-diamond-turning of silicon probed by Raman scattering. Journal of Materials Science Letters, 18, 1185-1187.
NLM
Pizani PS, Jasinevicius R, Duduch JG, Porto AJV. Ductile and brittle modes in single-point-diamond-turning of silicon probed by Raman scattering. Journal of Materials Science Letters. 1999 ; 18 1185-1187.[citado 2024 ago. 23 ]
Vancouver
Pizani PS, Jasinevicius R, Duduch JG, Porto AJV. Ductile and brittle modes in single-point-diamond-turning of silicon probed by Raman scattering. Journal of Materials Science Letters. 1999 ; 18 1185-1187.[citado 2024 ago. 23 ]
Trabalho de evento
Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering (1999)
Jasinevicius, R. G.; Pizani, P. S.; Duduch, Jaime Gilberto; Porto, Arthur José Vieira; Purquerio, Benedito de Moraes
Source: Proceedings. Conference titles: International Conference and General Meeting of the Europen Society for Precision Engineering and Nanotechnology. Unidade: EESC
Subjects: PROCESSOS DE FABRICAÇÃO (ENGENHARIA MECÂNICA), USINAGEM
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ABNT
JASINEVICIUS, R. G. et al. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. 1999, Anais.. Bremen: SHAKER, 1999. . Acesso em: 23 ago. 2024.
APA
Jasinevicius, R. G., Pizani, P. S., Duduch, J. G., Porto, A. J. V., & Purquerio, B. de M. (1999). Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. In Proceedings. Bremen: SHAKER.
NLM
Jasinevicius RG, Pizani PS, Duduch JG, Porto AJV, Purquerio B de M. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. Proceedings. 1999 ;[citado 2024 ago. 23 ]
Vancouver
Jasinevicius RG, Pizani PS, Duduch JG, Porto AJV, Purquerio B de M. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. Proceedings. 1999 ;[citado 2024 ago. 23 ]

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