Filtros : "Pizani, P. S." "TRABALHO DE EVENTO" Removido: "Rissato, S." Limpar

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  • Source: Conference Proceedings. Conference titles: Euspen International Conference. Unidade: EESC

    Subjects: ESPECTROSCOPIA, ENGENHARIA MECÂNICA

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    • ABNT

      PIZANI, P. S. e DUDUCH, Jaime Gilberto e JASINEVICIUS, Renato Goulart. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. 2010, Anais.. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2010. Disponível em: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf. Acesso em: 23 ago. 2024.
    • APA

      Pizani, P. S., Duduch, J. G., & Jasinevicius, R. G. (2010). Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. In Conference Proceedings. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
    • NLM

      Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
    • Vancouver

      Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
  • Source: Proceedings of the COBEM 2005. Conference titles: International Congress of Mechanical Engineering. Unidade: EESC

    Subjects: MUDANÇA DE FASE, DIAMANTE, FERRAMENTAS, ENGENHARIA MECÂNICA

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    • ABNT

      JASINEVICIUS, Renato Goulart e PIZANI, P. S. High pressure phase transformation in single crystal silicon during ductile regime diamond turning. 2005, Anais.. Rio de Janeiro, RJ: ABCM, 2005. Disponível em: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf. Acesso em: 23 ago. 2024.
    • APA

      Jasinevicius, R. G., & Pizani, P. S. (2005). High pressure phase transformation in single crystal silicon during ductile regime diamond turning. In Proceedings of the COBEM 2005. Rio de Janeiro, RJ: ABCM. Recuperado de http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
    • NLM

      Jasinevicius RG, Pizani PS. High pressure phase transformation in single crystal silicon during ductile regime diamond turning [Internet]. Proceedings of the COBEM 2005. 2005 ;[citado 2024 ago. 23 ] Available from: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
    • Vancouver

      Jasinevicius RG, Pizani PS. High pressure phase transformation in single crystal silicon during ductile regime diamond turning [Internet]. Proceedings of the COBEM 2005. 2005 ;[citado 2024 ago. 23 ] Available from: http://www.abcm.org.br/anais/cobem/2005/PDF/COBEM2005-1560.pdf
  • Conference titles: Congresso Brasileiro de Engenharia de Fabricação. Unidade: EESC

    Subjects: FERRAMENTAS, MUDANÇA DE FASE, ENGENHARIA MECÂNICA

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    • ABNT

      JASINEVICIUS, Renato Goulart et al. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001, Anais.. Curitiba: ABCM, 2001. . Acesso em: 23 ago. 2024.
    • APA

      Jasinevicius, R. G., Duduch, J. G., Pagotto, C. R., & Pizani, P. S. (2001). Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. In . Curitiba: ABCM.
    • NLM

      Jasinevicius RG, Duduch JG, Pagotto CR, Pizani PS. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001 ;[citado 2024 ago. 23 ]
    • Vancouver

      Jasinevicius RG, Duduch JG, Pagotto CR, Pizani PS. Relação entre a transformação de fase e a deformação plástica em silício estudada através de microindentação e espectroscopia Raman. 2001 ;[citado 2024 ago. 23 ]
  • Source: Proceedings. Conference titles: International Conference and General Meeting of the Europen Society for Precision Engineering and Nanotechnology. Unidade: EESC

    Subjects: PROCESSOS DE FABRICAÇÃO (ENGENHARIA MECÂNICA), USINAGEM

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    • ABNT

      JASINEVICIUS, R. G. et al. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. 1999, Anais.. Bremen: SHAKER, 1999. . Acesso em: 23 ago. 2024.
    • APA

      Jasinevicius, R. G., Pizani, P. S., Duduch, J. G., Porto, A. J. V., & Purquerio, B. de M. (1999). Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. In Proceedings. Bremen: SHAKER.
    • NLM

      Jasinevicius RG, Pizani PS, Duduch JG, Porto AJV, Purquerio B de M. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. Proceedings. 1999 ;[citado 2024 ago. 23 ]
    • Vancouver

      Jasinevicius RG, Pizani PS, Duduch JG, Porto AJV, Purquerio B de M. Structural alteration on single crystal silicon surface resultant from diamond turning probed by raman scattering. Proceedings. 1999 ;[citado 2024 ago. 23 ]

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