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Trabalho de evento-resumo
Photoluminescence properties of MgTi'O IND.3' thin films prepared by the polymeric precursor method (2010)
Ferri, E. A. V.; Mazzo, T. M.; Paris, E. C.; Pizani, P. S.; Siu Li, Máximo; Varela, J. A.; Longo, E.
Source: Abstracts. Conference titles: Brazilian MRS Meeting. Unidade: IFSC
Subjects: FILMES FINOS, FOTOLUMINESCÊNCIA, MATERIAIS ÓPTICOS
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ABNT
FERRI, E. A. V. et al. Photoluminescence properties of MgTi'O IND.3' thin films prepared by the polymeric precursor method. 2010, Anais.. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat, 2010. . Acesso em: 23 ago. 2024.
APA
Ferri, E. A. V., Mazzo, T. M., Paris, E. C., Pizani, P. S., Siu Li, M., Varela, J. A., & Longo, E. (2010). Photoluminescence properties of MgTi'O IND.3' thin films prepared by the polymeric precursor method. In Abstracts. Rio de Janeiro: Sociedade Brasileira de Pesquisa em Materiais - SBPMat.
NLM
Ferri EAV, Mazzo TM, Paris EC, Pizani PS, Siu Li M, Varela JA, Longo E. Photoluminescence properties of MgTi'O IND.3' thin films prepared by the polymeric precursor method. Abstracts. 2010 ;[citado 2024 ago. 23 ]
Vancouver
Ferri EAV, Mazzo TM, Paris EC, Pizani PS, Siu Li M, Varela JA, Longo E. Photoluminescence properties of MgTi'O IND.3' thin films prepared by the polymeric precursor method. Abstracts. 2010 ;[citado 2024 ago. 23 ]
Artigo de periodico
Investigation in SrTi'O IND.3'-CaTi'O IND.3'-PbTi'O IND.3' ternary thin films by dielectric proprieties and Raman spectroscopy (2010)
Pontes, D. S. L.; Longo, E.; Pontes, F. M.; Silva, Marcelo de Assumpção Pereira da ; Silva, J. H. D.; Chiquito, A. J.; Pizani, P. S.
Source: Journal of Sol-Gel Science and Technology. Unidade: IFSC
Subjects: FILMES FINOS, FERROELETRICIDADE, ESPECTROSCOPIA RAMAN
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
PONTES, D. S. L. et al. Investigation in SrTi'O IND.3'-CaTi'O IND.3'-PbTi'O IND.3' ternary thin films by dielectric proprieties and Raman spectroscopy. Journal of Sol-Gel Science and Technology, v. 55, n. 2, p. 151-157, 2010Tradução . . Disponível em: https://doi.org/10.1007/s10971-010-2227-4. Acesso em: 23 ago. 2024.
APA
Pontes, D. S. L., Longo, E., Pontes, F. M., Silva, M. de A. P. da, Silva, J. H. D., Chiquito, A. J., & Pizani, P. S. (2010). Investigation in SrTi'O IND.3'-CaTi'O IND.3'-PbTi'O IND.3' ternary thin films by dielectric proprieties and Raman spectroscopy. Journal of Sol-Gel Science and Technology, 55( 2), 151-157. doi:10.1007/s10971-010-2227-4
NLM
Pontes DSL, Longo E, Pontes FM, Silva M de AP da, Silva JHD, Chiquito AJ, Pizani PS. Investigation in SrTi'O IND.3'-CaTi'O IND.3'-PbTi'O IND.3' ternary thin films by dielectric proprieties and Raman spectroscopy [Internet]. Journal of Sol-Gel Science and Technology. 2010 ; 55( 2): 151-157.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1007/s10971-010-2227-4
Vancouver
Pontes DSL, Longo E, Pontes FM, Silva M de AP da, Silva JHD, Chiquito AJ, Pizani PS. Investigation in SrTi'O IND.3'-CaTi'O IND.3'-PbTi'O IND.3' ternary thin films by dielectric proprieties and Raman spectroscopy [Internet]. Journal of Sol-Gel Science and Technology. 2010 ; 55( 2): 151-157.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1007/s10971-010-2227-4
Artigo de periodico
Electronic structure and optical properties of BaMo'O IND. 4' powders (2010)
Sczancoski, J. C.; Cavalcante, L. S.; Marana, N. L.; Silva, R. O.; Tranquilin, R. L.; Joya, M. R.; Pizani, P. S.; Varela, J. A.; Sambrano, J. R.; Siu Li, Máximo; Longo, E.; Andrés, J.
Source: Current Applied Physics. Unidade: IFSC
Subjects: TECNOLOGIA DE MICRO-ONDAS, FOTOLUMINESCÊNCIA, EMISSÃO DA LUZ, TEMPERATURA AMBIENTE, FILMES FINOS
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ABNT
SCZANCOSKI, J. C. et al. Electronic structure and optical properties of BaMo'O IND. 4' powders. Current Applied Physics, v. 10, n. 2, p. 614-624, 2010Tradução . . Disponível em: https://doi.org/10.1016/j.cap.2009.08.006. Acesso em: 23 ago. 2024.
APA
Sczancoski, J. C., Cavalcante, L. S., Marana, N. L., Silva, R. O., Tranquilin, R. L., Joya, M. R., et al. (2010). Electronic structure and optical properties of BaMo'O IND. 4' powders. Current Applied Physics, 10( 2), 614-624. doi:10.1016/j.cap.2009.08.006
NLM
Sczancoski JC, Cavalcante LS, Marana NL, Silva RO, Tranquilin RL, Joya MR, Pizani PS, Varela JA, Sambrano JR, Siu Li M, Longo E, Andrés J. Electronic structure and optical properties of BaMo'O IND. 4' powders [Internet]. Current Applied Physics. 2010 ; 10( 2): 614-624.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1016/j.cap.2009.08.006
Vancouver
Sczancoski JC, Cavalcante LS, Marana NL, Silva RO, Tranquilin RL, Joya MR, Pizani PS, Varela JA, Sambrano JR, Siu Li M, Longo E, Andrés J. Electronic structure and optical properties of BaMo'O IND. 4' powders [Internet]. Current Applied Physics. 2010 ; 10( 2): 614-624.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1016/j.cap.2009.08.006
Trabalho de evento
Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals (2010)
Pizani, P. S.; Duduch, Jaime Gilberto; Jasinevicius, Renato Goulart
Source: Conference Proceedings. Conference titles: Euspen International Conference. Unidade: EESC
Subjects: ESPECTROSCOPIA, ENGENHARIA MECÂNICA
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ABNT
PIZANI, P. S. e DUDUCH, Jaime Gilberto e JASINEVICIUS, Renato Goulart. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. 2010, Anais.. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo, 2010. Disponível em: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf. Acesso em: 23 ago. 2024.
APA
Pizani, P. S., Duduch, J. G., & Jasinevicius, R. G. (2010). Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals. In Conference Proceedings. Deft, Netherlands: Escola de Engenharia de São Carlos, Universidade de São Paulo. Recuperado de https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
NLM
Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf
Vancouver
Pizani PS, Duduch JG, Jasinevicius RG. Micro raman spectroscopy as a powerful technique to analyze structural phase transitions of silicon crystals [Internet]. Conference Proceedings. 2010 ;[citado 2024 ago. 23 ] Available from: https://repositorio.usp.br/directbitstream/2cfeb97a-2248-4182-9b4f-b3b4b80004ca/OK___trabalho%2022%20-%20Micro%20Raman%20spectroscopy%20as%20a%20powerful%20technique%20to%20analyze%20structural%20phase%20transitions%20of%20silicon%20crystals.%20%2810th%20International%20Conference%20of%20the%20european%20society%20of%20precision%20engineering%20and.pdf

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