Enhancing multiscale fractal descriptors using functional data analysis (2010)
Florindo, João Batista; Castro, Mário de 
; Bruno, Odemir Martinez
Source: International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. Unidades: ICMC, IFSC
Subjects: FRACTAIS, INFERÊNCIA BAYESIANA, ESTATÍSTICA APLICADA, ANÁLISE DE DADOS
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FLORINDO, João Batista e CASTRO, Mário de e BRUNO, Odemir Martinez. Enhancing multiscale fractal descriptors using functional data analysis. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering, v. 20, n. 11, p. 3443-3460, 2010Tradução . . Disponível em: https://doi.org/10.1142/S0218127410027805. Acesso em: 13 nov. 2024.APA
Florindo, J. B., Castro, M. de, & Bruno, O. M. (2010). Enhancing multiscale fractal descriptors using functional data analysis. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering, 20( 11), 3443-3460. doi:10.1142/S0218127410027805NLM
Florindo JB, Castro M de, Bruno OM. Enhancing multiscale fractal descriptors using functional data analysis [Internet]. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. 2010 ; 20( 11): 3443-3460.[citado 2024 nov. 13 ] Available from: https://doi.org/10.1142/S0218127410027805Vancouver
Florindo JB, Castro M de, Bruno OM. Enhancing multiscale fractal descriptors using functional data analysis [Internet]. International Journal of Bifurcation and Chaos in Applied Sciences and Engineering. 2010 ; 20( 11): 3443-3460.[citado 2024 nov. 13 ] Available from: https://doi.org/10.1142/S0218127410027805
