Dielectric measurement of silica aerogels (1987)
Source: Crystal Lattice Defects and Amorphous Materials. Unidade: IFSC
Subjects: CRESCIMENTO DE CRISTAIS, FÍSICA
ABNT
SANTOS, D I et al. Dielectric measurement of silica aerogels. Crystal Lattice Defects and Amorphous Materials, v. 15, p. 381-5, 1987Tradução . . Acesso em: 24 abr. 2024.APA
Santos, D. I., Ziemath, E. C., Silva, A. A., Basso, H. C., & Aegerter, M. A. (1987). Dielectric measurement of silica aerogels. Crystal Lattice Defects and Amorphous Materials, 15, 381-5.NLM
Santos DI, Ziemath EC, Silva AA, Basso HC, Aegerter MA. Dielectric measurement of silica aerogels. Crystal Lattice Defects and Amorphous Materials. 1987 ;15 381-5.[citado 2024 abr. 24 ]Vancouver
Santos DI, Ziemath EC, Silva AA, Basso HC, Aegerter MA. Dielectric measurement of silica aerogels. Crystal Lattice Defects and Amorphous Materials. 1987 ;15 381-5.[citado 2024 abr. 24 ]