Tojeiro, Cyntia Arantes Vieira; Louzada, Francisco 
; Bolfarine, Heleno
Source: Journal of Applied Statistics. Unidade: IME
Assunto: INFERÊNCIA BAYESIANA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
TOJEIRO, Cyntia Arantes Vieira e LOUZADA, Francisco e BOLFARINE, Heleno. A Bayesian analysis for accelerated lifetime tests under an exponential power law model with threshold stress. Journal of Applied Statistics, v. 31, n. 6, p. 685-691, 2004Tradução . . Disponível em: https://doi.org/10.1080/1478881042000214668. Acesso em: 08 ago. 2024.APA
Tojeiro, C. A. V., Louzada, F., & Bolfarine, H. (2004). A Bayesian analysis for accelerated lifetime tests under an exponential power law model with threshold stress. Journal of Applied Statistics, 31( 6), 685-691. doi:10.1080/1478881042000214668NLM
Tojeiro CAV, Louzada F, Bolfarine H. A Bayesian analysis for accelerated lifetime tests under an exponential power law model with threshold stress [Internet]. Journal of Applied Statistics. 2004 ; 31( 6): 685-691.[citado 2024 ago. 08 ] Available from: https://doi.org/10.1080/1478881042000214668Vancouver
Tojeiro CAV, Louzada F, Bolfarine H. A Bayesian analysis for accelerated lifetime tests under an exponential power law model with threshold stress [Internet]. Journal of Applied Statistics. 2004 ; 31( 6): 685-691.[citado 2024 ago. 08 ] Available from: https://doi.org/10.1080/1478881042000214668
