Source: Acta Microscopica. Conference titles: Brazilian Conference on Microscopy of Materials. Unidade: IQSC
Assunto: ELETROQUÍMICA
ABNT
BENTO, Carlos Alberto da Silva et al. The Ti-6Al-4V/Ti'O IND.2' interface characterization by scanning electron microscopy associated with energy dispersive X-ray microanalysis. Acta Microscopica. São Carlos: Instituto de Química de São Carlos, Universidade de São Paulo. . Acesso em: 02 ago. 2024. , 2000APA
Bento, C. A. da S., Tremiliosi Filho, G., Alencar, A. C., Souza, P. C. D., & Guastaldi, A. C. (2000). The Ti-6Al-4V/Ti'O IND.2' interface characterization by scanning electron microscopy associated with energy dispersive X-ray microanalysis. Acta Microscopica. São Carlos: Instituto de Química de São Carlos, Universidade de São Paulo.NLM
Bento CA da S, Tremiliosi Filho G, Alencar AC, Souza PCD, Guastaldi AC. The Ti-6Al-4V/Ti'O IND.2' interface characterization by scanning electron microscopy associated with energy dispersive X-ray microanalysis. Acta Microscopica. 2000 ; 9 61-62.[citado 2024 ago. 02 ]Vancouver
Bento CA da S, Tremiliosi Filho G, Alencar AC, Souza PCD, Guastaldi AC. The Ti-6Al-4V/Ti'O IND.2' interface characterization by scanning electron microscopy associated with energy dispersive X-ray microanalysis. Acta Microscopica. 2000 ; 9 61-62.[citado 2024 ago. 02 ]