Tin oxide nanometric films doped with nickel for sulfur dioxide environment monitoring (2003)
Source: CLACSA 2003. Conference titles: Latin American Congress of Surface Science and its Applications. Unidade: EP
Assunto: NANOTECNOLOGIA
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HIDALGO FALLA, Maria del Pilar et al. Tin oxide nanometric films doped with nickel for sulfur dioxide environment monitoring. 2003, Anais.. Pucón: Universidad Tecnica Federico Santa Maria, 2003. Disponível em: https://doi.org/10.1002/pssc.200404892. Acesso em: 17 out. 2024.APA
Hidalgo Falla, M. del P., Gouvêa, D., Ramírez Fernandez, F. J., & Peres, H. E. M. (2003). Tin oxide nanometric films doped with nickel for sulfur dioxide environment monitoring. In CLACSA 2003. Pucón: Universidad Tecnica Federico Santa Maria. doi:10.1002/pssc.200404892NLM
Hidalgo Falla M del P, Gouvêa D, Ramírez Fernandez FJ, Peres HEM. Tin oxide nanometric films doped with nickel for sulfur dioxide environment monitoring [Internet]. CLACSA 2003. 2003 ;[citado 2024 out. 17 ] Available from: https://doi.org/10.1002/pssc.200404892Vancouver
Hidalgo Falla M del P, Gouvêa D, Ramírez Fernandez FJ, Peres HEM. Tin oxide nanometric films doped with nickel for sulfur dioxide environment monitoring [Internet]. CLACSA 2003. 2003 ;[citado 2024 out. 17 ] Available from: https://doi.org/10.1002/pssc.200404892