First-principles investigation of functionalization-defects on silicon surfaces (2006)
Source: Surface Science. Unidade: IF
Subjects: FÍSICA DA MATÉRIA CONDENSADA, QUÍMICA, FÍSICA
ABNT
CUCINOTTA, C S et al. First-principles investigation of functionalization-defects on silicon surfaces. Surface Science, v. 600, n. 18, p. 3892-3897, 2006Tradução . . Disponível em: https://doi.org/10.1016/j.susc.2006.01.099. Acesso em: 04 nov. 2024.APA
Cucinotta, C. S., Bonferroni, B., Ferretti, A., Ruini, A., Caldas, M. J., & Molinari, E. (2006). First-principles investigation of functionalization-defects on silicon surfaces. Surface Science, 600( 18), 3892-3897. doi:10.1016/j.susc.2006.01.099NLM
Cucinotta CS, Bonferroni B, Ferretti A, Ruini A, Caldas MJ, Molinari E. First-principles investigation of functionalization-defects on silicon surfaces [Internet]. Surface Science. 2006 ; 600( 18): 3892-3897.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1016/j.susc.2006.01.099Vancouver
Cucinotta CS, Bonferroni B, Ferretti A, Ruini A, Caldas MJ, Molinari E. First-principles investigation of functionalization-defects on silicon surfaces [Internet]. Surface Science. 2006 ; 600( 18): 3892-3897.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1016/j.susc.2006.01.099