Filtros : "Leite, J. R." "Universidade Federal da Bahia (UFBA)" Removido: " FCF003" Limpar

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  • Source: Microelectronics Journal. Unidade: IF

    Assunto: FOTOLUMINESCÊNCIA

    Acesso à fonteAcesso à fonteDOIHow to cite
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    • ABNT

      ARAUJO, C. Moyses et al. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si. Microelectronics Journal, v. 33, n. 4, p. 365-369, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0026-2692(01)00133-1. Acesso em: 10 out. 2024.
    • APA

      Araujo, C. M., Fernandez, J. R. L., Silva, A. F. da, Pepe, I., Leite, J. R., Sernelius, B. E., et al. (2002). Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si. Microelectronics Journal, 33( 4), 365-369. doi:10.1016/s0026-2692(01)00133-1
    • NLM

      Araujo CM, Fernandez JRL, Silva AF da, Pepe I, Leite JR, Sernelius BE, Tabata A, Persson C, Ahuja R, As DJ, Schikora D, Lischka K. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si [Internet]. Microelectronics Journal. 2002 ; 33( 4): 365-369.[citado 2024 out. 10 ] Available from: https://doi.org/10.1016/s0026-2692(01)00133-1
    • Vancouver

      Araujo CM, Fernandez JRL, Silva AF da, Pepe I, Leite JR, Sernelius BE, Tabata A, Persson C, Ahuja R, As DJ, Schikora D, Lischka K. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si [Internet]. Microelectronics Journal. 2002 ; 33( 4): 365-369.[citado 2024 out. 10 ] Available from: https://doi.org/10.1016/s0026-2692(01)00133-1
  • Source: Journal of Crystal Growth. Unidade: IF

    Subjects: DIELÉTRICOS, RESISTÊNCIA ELÉTRICA, MATERIAIS (ANÁLISE;TESTES), RESISTÊNCIA DOS MATERIAIS

    Acesso à fonteAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      FERNANDEZ, J R L et al. Electrical resistivity and band-gap shift of Si-doped GaN and metal-nometal transition in cubic GaN, InN and AlN systems. Journal of Crystal Growth, v. 231, n. 3, p. 420-427, 2001Tradução . . Disponível em: https://doi.org/10.1016/s0022-0248(01)01473-7. Acesso em: 10 out. 2024.
    • APA

      Fernandez, J. R. L., Araujo, C. M., Silva, A. F. da, Leite, J. R., Sernelius, B. E., Tabata, A., et al. (2001). Electrical resistivity and band-gap shift of Si-doped GaN and metal-nometal transition in cubic GaN, InN and AlN systems. Journal of Crystal Growth, 231( 3), 420-427. doi:10.1016/s0022-0248(01)01473-7
    • NLM

      Fernandez JRL, Araujo CM, Silva AF da, Leite JR, Sernelius BE, Tabata A, Abramog E, Chitta VA, Persson C, Ahuja R, Pepe I, As DJ, Frey T, Schikora D, Lischka K. Electrical resistivity and band-gap shift of Si-doped GaN and metal-nometal transition in cubic GaN, InN and AlN systems [Internet]. Journal of Crystal Growth. 2001 ; 231( 3): 420-427.[citado 2024 out. 10 ] Available from: https://doi.org/10.1016/s0022-0248(01)01473-7
    • Vancouver

      Fernandez JRL, Araujo CM, Silva AF da, Leite JR, Sernelius BE, Tabata A, Abramog E, Chitta VA, Persson C, Ahuja R, Pepe I, As DJ, Frey T, Schikora D, Lischka K. Electrical resistivity and band-gap shift of Si-doped GaN and metal-nometal transition in cubic GaN, InN and AlN systems [Internet]. Journal of Crystal Growth. 2001 ; 231( 3): 420-427.[citado 2024 out. 10 ] Available from: https://doi.org/10.1016/s0022-0248(01)01473-7

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