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Artigo de periodico
Structural properties of amorphous silicon nitride (1998)
Mota, F B; Justo Filho, João Francisco ; Fazzio, A
Source: Physical Review B. Unidade: IF
Assunto: MATÉRIA CONDENSADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MOTA, F B e JUSTO FILHO, João Francisco e FAZZIO, A. Structural properties of amorphous silicon nitride. Physical Review B, v. 58, n. 3, p. 8323-8328, 1998Tradução . . Disponível em: https://doi.org/10.1103/physrevb.58.8323. Acesso em: 10 ago. 2024.
APA
Mota, F. B., Justo Filho, J. F., & Fazzio, A. (1998). Structural properties of amorphous silicon nitride. Physical Review B, 58( 3), 8323-8328. doi:10.1103/physrevb.58.8323
NLM
Mota FB, Justo Filho JF, Fazzio A. Structural properties of amorphous silicon nitride [Internet]. Physical Review B. 1998 ; 58( 3): 8323-8328.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1103/physrevb.58.8323
Vancouver
Mota FB, Justo Filho JF, Fazzio A. Structural properties of amorphous silicon nitride [Internet]. Physical Review B. 1998 ; 58( 3): 8323-8328.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1103/physrevb.58.8323
Trabalho de evento-anais periodico
Theoretical study of defect complexes related with antisities in GaAs (1998)
Fazzio, A; Janotti, A.; Mota, R.; Piquini, P
Source: Radiation Effects and Defect in Solids. Conference titles: Symposium on Defect Dependent Processes in Insulators and Semiconductors. Unidade: IF
Subjects: FÍSICA, FÍSICA NUCLEAR
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
FAZZIO, A et al. Theoretical study of defect complexes related with antisities in GaAs. Radiation Effects and Defect in Solids. London: Gordon and Breach Science Publishers. . Acesso em: 10 ago. 2024. , 1998
APA
Fazzio, A., Janotti, A., Mota, R., & Piquini, P. (1998). Theoretical study of defect complexes related with antisities in GaAs. Radiation Effects and Defect in Solids. London: Gordon and Breach Science Publishers.
NLM
Fazzio A, Janotti A, Mota R, Piquini P. Theoretical study of defect complexes related with antisities in GaAs. Radiation Effects and Defect in Solids. 1998 ; 146( 1-4): 65-70.[citado 2024 ago. 10 ]
Vancouver
Fazzio A, Janotti A, Mota R, Piquini P. Theoretical study of defect complexes related with antisities in GaAs. Radiation Effects and Defect in Solids. 1998 ; 146( 1-4): 65-70.[citado 2024 ago. 10 ]
Artigo de periodico
Structural and electronic properties of silicon nitride materials (1998)
Mota, F B; Justo Filho, João Francisco ; Fazzio, A
Source: International Journal of Quantum Chemistry. Unidade: IF
Subjects: QUÍMICA TEÓRICA, FÍSICO-QUÍMICA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
MOTA, F B e JUSTO FILHO, João Francisco e FAZZIO, A. Structural and electronic properties of silicon nitride materials. International Journal of Quantum Chemistry, v. 70, p. 973-980, 1998Tradução . . Disponível em: https://doi.org/10.1002/(sici)1097-461x(1998)70:4/5%3C973::aid-qua43%3E3.3.co;2-j. Acesso em: 10 ago. 2024.
APA
Mota, F. B., Justo Filho, J. F., & Fazzio, A. (1998). Structural and electronic properties of silicon nitride materials. International Journal of Quantum Chemistry, 70, 973-980. doi:10.1002/(sici)1097-461x(1998)70:4/5%3C973::aid-qua43%3E3.3.co;2-j
NLM
Mota FB, Justo Filho JF, Fazzio A. Structural and electronic properties of silicon nitride materials [Internet]. International Journal of Quantum Chemistry. 1998 ; 70 973-980.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1002/(sici)1097-461x(1998)70:4/5%3C973::aid-qua43%3E3.3.co;2-j
Vancouver
Mota FB, Justo Filho JF, Fazzio A. Structural and electronic properties of silicon nitride materials [Internet]. International Journal of Quantum Chemistry. 1998 ; 70 973-980.[citado 2024 ago. 10 ] Available from: https://doi.org/10.1002/(sici)1097-461x(1998)70:4/5%3C973::aid-qua43%3E3.3.co;2-j

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