Filtros : "Universidade Federal de Pernambuco (UFPE)" "ICMC-SME" "INFERÊNCIA PARAMÉTRICA" Limpar

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  • Source: Biometrical Journal. Unidade: ICMC

    Subjects: INFERÊNCIA PARAMÉTRICA, PROBABILIDADE, INFERÊNCIA BAYESIANA

    Acesso à fonteDOIHow to cite
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    • ABNT

      LEMONTE, Artur J e BAZÁN GUZMÁN, Jorge Luis. New class of Johnson 'S IND. B' distributions and its associated regression model for rates and proportions. Biometrical Journal, v. 58, n. 4, p. 727–746, 2016Tradução . . Disponível em: https://doi.org/10.1002/bimj.201500030. Acesso em: 17 nov. 2024.
    • APA

      Lemonte, A. J., & Bazán Guzmán, J. L. (2016). New class of Johnson 'S IND. B' distributions and its associated regression model for rates and proportions. Biometrical Journal, 58( 4), 727–746. doi:10.1002/bimj.201500030
    • NLM

      Lemonte AJ, Bazán Guzmán JL. New class of Johnson 'S IND. B' distributions and its associated regression model for rates and proportions [Internet]. Biometrical Journal. 2016 ; 58( 4): 727–746.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1002/bimj.201500030
    • Vancouver

      Lemonte AJ, Bazán Guzmán JL. New class of Johnson 'S IND. B' distributions and its associated regression model for rates and proportions [Internet]. Biometrical Journal. 2016 ; 58( 4): 727–746.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1002/bimj.201500030
  • Source: Journal of Statistical Computation and Simulation. Unidade: ICMC

    Subjects: ESTATÍSTICA, ESTATÍSTICA APLICADA, INFERÊNCIA ESTATÍSTICA, INFERÊNCIA BAYESIANA, REGRESSÃO LINEAR, INFERÊNCIA PARAMÉTRICA, PROBABILIDADE

    Acesso à fonteDOIHow to cite
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    • ABNT

      RODRIGUES, Josemar et al. Latent cure rate model under repair system and threshold effect. Journal of Statistical Computation and Simulation, v. 85, n. 14, p. 2860-2873, 2015Tradução . . Disponível em: https://doi.org/10.1080/00949655.2014.943223. Acesso em: 17 nov. 2024.
    • APA

      Rodrigues, J., Balakrishnan, N., Cordeiro, G. M., Castro, M. de, & Cancho, V. G. (2015). Latent cure rate model under repair system and threshold effect. Journal of Statistical Computation and Simulation, 85( 14), 2860-2873. doi:10.1080/00949655.2014.943223
    • NLM

      Rodrigues J, Balakrishnan N, Cordeiro GM, Castro M de, Cancho VG. Latent cure rate model under repair system and threshold effect [Internet]. Journal of Statistical Computation and Simulation. 2015 ; 85( 14): 2860-2873.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1080/00949655.2014.943223
    • Vancouver

      Rodrigues J, Balakrishnan N, Cordeiro GM, Castro M de, Cancho VG. Latent cure rate model under repair system and threshold effect [Internet]. Journal of Statistical Computation and Simulation. 2015 ; 85( 14): 2860-2873.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1080/00949655.2014.943223
  • Source: Journal of Applied Statistics. Unidade: ICMC

    Subjects: PROBABILIDADE, INFERÊNCIA BAYESIANA, INFERÊNCIA PARAMÉTRICA, INFERÊNCIA ESTATÍSTICA

    Acesso à fonteDOIHow to cite
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    • ABNT

      RODRIGUES, Josemar e CORDEIRO, Gauss M e BAZÁN GUZMÁN, Jorge Luis. An extended exponentiated-G-negative binomial family with threshold effect. Journal of Applied Statistics, v. 41, n. 9, p. 2056-2074, 2014Tradução . . Disponível em: https://doi.org/10.1080/02664763.2014.907396. Acesso em: 17 nov. 2024.
    • APA

      Rodrigues, J., Cordeiro, G. M., & Bazán Guzmán, J. L. (2014). An extended exponentiated-G-negative binomial family with threshold effect. Journal of Applied Statistics, 41( 9), 2056-2074. doi:10.1080/02664763.2014.907396
    • NLM

      Rodrigues J, Cordeiro GM, Bazán Guzmán JL. An extended exponentiated-G-negative binomial family with threshold effect [Internet]. Journal of Applied Statistics. 2014 ; 41( 9): 2056-2074.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1080/02664763.2014.907396
    • Vancouver

      Rodrigues J, Cordeiro GM, Bazán Guzmán JL. An extended exponentiated-G-negative binomial family with threshold effect [Internet]. Journal of Applied Statistics. 2014 ; 41( 9): 2056-2074.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1080/02664763.2014.907396

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