Source: Radiation Physics and Chemistry. Unidade: FFCLRP
Subjects: MAMOGRAFIA, RADIOGRAFIA, ESPECTROSCOPIA DE RAIO X (ESTUDO COMPARATIVO)
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
TOMAL, A. e CUNHA, D. M. e POLETTI, Martín Eduardo. Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors. Radiation Physics and Chemistry, v. 95, p. 217-220, 2014Tradução . . Disponível em: https://doi.org/10.1016/j.radphyschem.2013.01.002. Acesso em: 07 out. 2024.APA
Tomal, A., Cunha, D. M., & Poletti, M. E. (2014). Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors. Radiation Physics and Chemistry, 95, 217-220. doi:10.1016/j.radphyschem.2013.01.002NLM
Tomal A, Cunha DM, Poletti ME. Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors [Internet]. Radiation Physics and Chemistry. 2014 ; 95 217-220.[citado 2024 out. 07 ] Available from: https://doi.org/10.1016/j.radphyschem.2013.01.002Vancouver
Tomal A, Cunha DM, Poletti ME. Comparison of beam quality parameters computed from mammographic x-ray spectra measured with different high-resolution semiconductor detectors [Internet]. Radiation Physics and Chemistry. 2014 ; 95 217-220.[citado 2024 out. 07 ] Available from: https://doi.org/10.1016/j.radphyschem.2013.01.002
