Source: ISIJ International. Unidade: EP
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CAMPOS, Marcos Flávio de et al. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International, v. 44, n. 3, p. 591-597, 2004Tradução . . Acesso em: 06 set. 2024.APA
Campos, M. F. de, Landgraf, F. J. G., Takanohashi, R., Chagas, F. C., Falleiros, I. G. S., Fronzaglia, G. C., & Kahn, H. (2004). Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International, 44( 3), 591-597.NLM
Campos MF de, Landgraf FJG, Takanohashi R, Chagas FC, Falleiros IGS, Fronzaglia GC, Kahn H. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International. 2004 ; 44( 3): 591-597.[citado 2024 set. 06 ]Vancouver
Campos MF de, Landgraf FJG, Takanohashi R, Chagas FC, Falleiros IGS, Fronzaglia GC, Kahn H. Effect of the hot band grain size and intermediate annealing on the deformation and recrystallization textures in low silicon electrical steels. ISIJ International. 2004 ; 44( 3): 591-597.[citado 2024 set. 06 ]