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Filtros : "Instituto Nacional de Pesquisas Espaciais (INPE)" "Produção científica" "IF-FEP" Limpar

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  • Relatorio tecnico

    Measurement of miniband parameters of a doped superlattice by photoluminescence in high magnetic fields (2020)

    Oliveira, R F; Henriques, André Bohomoletz ; Lamas, Tomás Erikson; Quivy, Alain André ; Abramof, E

    Unidade: IF

    Subjects: MATÉRIA CONDENSADA, CAMPO MAGNÉTICO, FOTOLUMINESCÊNCIA

    Acesso à fonteHow to cite
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    • ABNT

      OLIVEIRA, R F et al. Measurement of miniband parameters of a doped superlattice by photoluminescence in high magnetic fields. . São Paulo: Instituto de Física, Universidade de São Paulo. Disponível em: https://arxiv.org/pdf/cond-mat/0404254.pdf. Acesso em: 06 out. 2024. , 2020

    • APA

      Oliveira, R. F., Henriques, A. B., Lamas, T. E., Quivy, A. A., & Abramof, E. (2020). Measurement of miniband parameters of a doped superlattice by photoluminescence in high magnetic fields. São Paulo: Instituto de Física, Universidade de São Paulo. Recuperado de https://arxiv.org/pdf/cond-mat/0404254.pdf

    • NLM

      Oliveira RF, Henriques AB, Lamas TE, Quivy AA, Abramof E. Measurement of miniband parameters of a doped superlattice by photoluminescence in high magnetic fields [Internet]. 2020 ;[citado 2024 out. 06 ] Available from: https://arxiv.org/pdf/cond-mat/0404254.pdf

    • Vancouver

      Oliveira RF, Henriques AB, Lamas TE, Quivy AA, Abramof E. Measurement of miniband parameters of a doped superlattice by photoluminescence in high magnetic fields [Internet]. 2020 ;[citado 2024 out. 06 ] Available from: https://arxiv.org/pdf/cond-mat/0404254.pdf

  • Artigo de periodico

    A bayesian estimate of the cmb-large-scale structure cross-correlation (2016)

    Santos, Edivaldo Moura; Carvalho, F. C.; Penna-Lima, M.; Novaes, C. P.; Wuensche, C. A.

    Source: ASTROPHYSICAL JOURNAL. Unidade: IF

    Subjects: COSMOLOGIA, GALÁXIAS

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    • ABNT

      SANTOS, Edivaldo Moura et al. A bayesian estimate of the cmb-large-scale structure cross-correlation. ASTROPHYSICAL JOURNAL, v. 826, n. 2, p. 121, 2016Tradução . . Disponível em: http://iopscience.iop.org/article/10.3847/0004-637X/826/2/121/meta. Acesso em: 06 out. 2024.

    • APA

      Santos, E. M., Carvalho, F. C., Penna-Lima, M., Novaes, C. P., & Wuensche, C. A. (2016). A bayesian estimate of the cmb-large-scale structure cross-correlation. ASTROPHYSICAL JOURNAL, 826( 2), 121. doi:10.3847/0004-637X/826/2/121

    • NLM

      Santos EM, Carvalho FC, Penna-Lima M, Novaes CP, Wuensche CA. A bayesian estimate of the cmb-large-scale structure cross-correlation [Internet]. ASTROPHYSICAL JOURNAL. 2016 ; 826( 2): 121.[citado 2024 out. 06 ] Available from: http://iopscience.iop.org/article/10.3847/0004-637X/826/2/121/meta

    • Vancouver

      Santos EM, Carvalho FC, Penna-Lima M, Novaes CP, Wuensche CA. A bayesian estimate of the cmb-large-scale structure cross-correlation [Internet]. ASTROPHYSICAL JOURNAL. 2016 ; 826( 2): 121.[citado 2024 out. 06 ] Available from: http://iopscience.iop.org/article/10.3847/0004-637X/826/2/121/meta

  • Trabalho de evento-anais periodico

    Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction (2009)

    Freitas, Raul de Oliveira; Diaz, Beatriz; Abramof, Eduardo; Quivy, A. A.; Morelhão, Sérgio Luiz

    Source: Physica Status Solidi A - Applications and Materials Science. Conference titles: Biennial Conference on High Resolution X-Ray Diffraction and Imaging. Unidade: IF

    Subjects: POÇOS QUÂNTICOS, DIFRAÇÃO POR RAIOS X

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    • ABNT

      FREITAS, Raul de Oliveira et al. Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction. Physica Status Solidi A - Applications and Materials Science. Weinheim: Wiley-VCH Verlag. Disponível em: http://www3.interscience.wiley.com/cgi-bin/fulltext/122462600/PDFSTART. Acesso em: 06 out. 2024. , 2009

    • APA

      Freitas, R. de O., Diaz, B., Abramof, E., Quivy, A. A., & Morelhão, S. L. (2009). Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction. Physica Status Solidi A - Applications and Materials Science. Weinheim: Wiley-VCH Verlag. Recuperado de http://www3.interscience.wiley.com/cgi-bin/fulltext/122462600/PDFSTART

    • NLM

      Freitas R de O, Diaz B, Abramof E, Quivy AA, Morelhão SL. Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction [Internet]. Physica Status Solidi A - Applications and Materials Science. 2009 ; 206( 8):[citado 2024 out. 06 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122462600/PDFSTART

    • Vancouver

      Freitas R de O, Diaz B, Abramof E, Quivy AA, Morelhão SL. Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction [Internet]. Physica Status Solidi A - Applications and Materials Science. 2009 ; 206( 8):[citado 2024 out. 06 ] Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122462600/PDFSTART
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