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Artigo de periodico
Estimation and influence diagnostics for zero-inflated hyper-Poisson regression model: full Bayesian analysis (2018)
Cancho, Vicente Garibay ; Yiqi, Bao; Fiorucci, José A.; Barriga, Gladys D. C.; Dey, Dipak K
Source: Communications in Statistics - Theory and Methods. Unidade: ICMC
Subjects: ESTATÍSTICA, ESTATÍSTICA APLICADA, INFERÊNCIA ESTATÍSTICA, INFERÊNCIA BAYESIANA, PROBABILIDADE, ANÁLISE DE SOBREVIVÊNCIA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CANCHO, Vicente Garibay et al. Estimation and influence diagnostics for zero-inflated hyper-Poisson regression model: full Bayesian analysis. Communications in Statistics - Theory and Methods, v. 47, n. Ju 2018, p. 2741-2759, 2018Tradução . . Disponível em: https://doi.org/10.1080/03610926.2017.1342839. Acesso em: 03 nov. 2024.
APA
Cancho, V. G., Yiqi, B., Fiorucci, J. A., Barriga, G. D. C., & Dey, D. K. (2018). Estimation and influence diagnostics for zero-inflated hyper-Poisson regression model: full Bayesian analysis. Communications in Statistics - Theory and Methods, 47( Ju 2018), 2741-2759. doi:10.1080/03610926.2017.1342839
NLM
Cancho VG, Yiqi B, Fiorucci JA, Barriga GDC, Dey DK. Estimation and influence diagnostics for zero-inflated hyper-Poisson regression model: full Bayesian analysis [Internet]. Communications in Statistics - Theory and Methods. 2018 ; 47( Ju 2018): 2741-2759.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1080/03610926.2017.1342839
Vancouver
Cancho VG, Yiqi B, Fiorucci JA, Barriga GDC, Dey DK. Estimation and influence diagnostics for zero-inflated hyper-Poisson regression model: full Bayesian analysis [Internet]. Communications in Statistics - Theory and Methods. 2018 ; 47( Ju 2018): 2741-2759.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1080/03610926.2017.1342839
Trabalho de evento-anais periodico
Bayesian approach of the exponential poisson logarithmic model (2015)
Fioruci, José Augusto; Yiqi, Bao; Louzada, Francisco ; Cancho, Vicente Garibay
Source: Interdisciplinary Bayesian Statistics: EBEB 2014. Unidade: ICMC
Subjects: INFERÊNCIA BAYESIANA, INFERÊNCIA ESTATÍSTICA, ESTATÍSTICA, ESTATÍSTICA APLICADA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
FIORUCI, José Augusto et al. Bayesian approach of the exponential poisson logarithmic model. Interdisciplinary Bayesian Statistics: EBEB 2014. Cham: Springer. Disponível em: https://doi.org/10.1007/978-3-319-12454-4_21. Acesso em: 03 nov. 2024. , 2015
APA
Fioruci, J. A., Yiqi, B., Louzada, F., & Cancho, V. G. (2015). Bayesian approach of the exponential poisson logarithmic model. Interdisciplinary Bayesian Statistics: EBEB 2014. Cham: Springer. doi:10.1007/978-3-319-12454-4_21
NLM
Fioruci JA, Yiqi B, Louzada F, Cancho VG. Bayesian approach of the exponential poisson logarithmic model [Internet]. Interdisciplinary Bayesian Statistics: EBEB 2014. 2015 ;370 .[citado 2024 nov. 03 ] Available from: https://doi.org/10.1007/978-3-319-12454-4_21
Vancouver
Fioruci JA, Yiqi B, Louzada F, Cancho VG. Bayesian approach of the exponential poisson logarithmic model [Internet]. Interdisciplinary Bayesian Statistics: EBEB 2014. 2015 ;370 .[citado 2024 nov. 03 ] Available from: https://doi.org/10.1007/978-3-319-12454-4_21
Artigo de periodico
The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes (2015)
Louzada, Francisco ; Cancho, Vicente Garibay ; Yiqi, Bao
Source: Statistics. Unidade: ICMC
Subjects: INFERÊNCIA BAYESIANA, ESTATÍSTICA, ESTATÍSTICA APLICADA, REGRESSÃO LINEAR, ANÁLISE DE REGRESSÃO E DE CORRELAÇÃO
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
LOUZADA, Francisco e CANCHO, Vicente Garibay e YIQI, Bao. The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes. Statistics, v. 49, n. 4, 2015Tradução . . Disponível em: https://doi.org/10.1080/02331888.2014.925900. Acesso em: 03 nov. 2024.
APA
Louzada, F., Cancho, V. G., & Yiqi, B. (2015). The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes. Statistics, 49( 4). doi:10.1080/02331888.2014.925900
NLM
Louzada F, Cancho VG, Yiqi B. The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes [Internet]. Statistics. 2015 ; 49( 4):[citado 2024 nov. 03 ] Available from: https://doi.org/10.1080/02331888.2014.925900
Vancouver
Louzada F, Cancho VG, Yiqi B. The log-Weibull-negative-binomial regression model under latent failure causes and presence of randomized activation schemes [Internet]. Statistics. 2015 ; 49( 4):[citado 2024 nov. 03 ] Available from: https://doi.org/10.1080/02331888.2014.925900
Artigo de periodico
The destructive negative binomial cure rate model with a latent activation scheme (2013)
Cancho, Vicente Garibay ; Bandyopadhyay, Dipankar; Louzada, Francisco ; Yiqi, Bao
Source: Statistical Methodology. Unidade: ICMC
Subjects: ESTATÍSTICA APLICADA, REGRESSÃO LINEAR
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CANCHO, Vicente Garibay et al. The destructive negative binomial cure rate model with a latent activation scheme. Statistical Methodology, v. 13, p. 48-68, 2013Tradução . . Disponível em: https://doi.org/10.1016/j.stamet.2013.01.006. Acesso em: 03 nov. 2024.
APA
Cancho, V. G., Bandyopadhyay, D., Louzada, F., & Yiqi, B. (2013). The destructive negative binomial cure rate model with a latent activation scheme. Statistical Methodology, 13, 48-68. doi:10.1016/j.stamet.2013.01.006
NLM
Cancho VG, Bandyopadhyay D, Louzada F, Yiqi B. The destructive negative binomial cure rate model with a latent activation scheme [Internet]. Statistical Methodology. 2013 ; 13 48-68.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1016/j.stamet.2013.01.006
Vancouver
Cancho VG, Bandyopadhyay D, Louzada F, Yiqi B. The destructive negative binomial cure rate model with a latent activation scheme [Internet]. Statistical Methodology. 2013 ; 13 48-68.[citado 2024 nov. 03 ] Available from: https://doi.org/10.1016/j.stamet.2013.01.006
Relatorio tecnico
The weibull-negative-binomial model under latent failure causes with randomized activation schemes (2011)
Yiqi, Bao; Cancho, Vicente Garibay ; Louzada, Francisco
Unidade: ICMC
Subjects: ESTATÍSTICA, ESTATÍSTICA APLICADA, INFERÊNCIA BAYESIANA
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
YIQI, Bao e CANCHO, Vicente Garibay e LOUZADA, Francisco. The weibull-negative-binomial model under latent failure causes with randomized activation schemes. . São Carlos: ICMC-USP. Disponível em: https://repositorio.usp.br/directbitstream/b5954511-8b20-4c0e-b329-805c4a497dca/relatorio_371.pdf. Acesso em: 03 nov. 2024. , 2011
APA
Yiqi, B., Cancho, V. G., & Louzada, F. (2011). The weibull-negative-binomial model under latent failure causes with randomized activation schemes. São Carlos: ICMC-USP. Recuperado de https://repositorio.usp.br/directbitstream/b5954511-8b20-4c0e-b329-805c4a497dca/relatorio_371.pdf
NLM
Yiqi B, Cancho VG, Louzada F. The weibull-negative-binomial model under latent failure causes with randomized activation schemes [Internet]. 2011 ;[citado 2024 nov. 03 ] Available from: https://repositorio.usp.br/directbitstream/b5954511-8b20-4c0e-b329-805c4a497dca/relatorio_371.pdf
Vancouver
Yiqi B, Cancho VG, Louzada F. The weibull-negative-binomial model under latent failure causes with randomized activation schemes [Internet]. 2011 ;[citado 2024 nov. 03 ] Available from: https://repositorio.usp.br/directbitstream/b5954511-8b20-4c0e-b329-805c4a497dca/relatorio_371.pdf

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