Huaman, Jose Luis Clabel 
; Awan, Iram Taj; Rivera, V. A. G.; Nogueira, I. C.; Silva, Marcelo de Assumpção Pereira da ; Siu Li, Máximo ; Ferreira, S. O.; Marega Junior, Euclydes
Source: Applied Surface Science. Unidade: IFSC
Subjects: EMISSÃO DA LUZ, FILMES FINOS, FLUORESCÊNCIA
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HUAMAN, Jose Luis Clabel et al. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM. Applied Surface Science, v. No 2019, p. 982-993, 2019Tradução . . Disponível em: https://doi.org/10.1016/j.apsusc.2019.07.003. Acesso em: 06 nov. 2024.APA
Huaman, J. L. C., Awan, I. T., Rivera, V. A. G., Nogueira, I. C., Silva, M. de A. P. da, Siu Li, M., et al. (2019). Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM. Applied Surface Science, No 2019, 982-993. doi:10.1016/j.apsusc.2019.07.003NLM
Huaman JLC, Awan IT, Rivera VAG, Nogueira IC, Silva M de AP da, Siu Li M, Ferreira SO, Marega Junior E. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM [Internet]. Applied Surface Science. 2019 ; No 2019 982-993.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/j.apsusc.2019.07.003Vancouver
Huaman JLC, Awan IT, Rivera VAG, Nogueira IC, Silva M de AP da, Siu Li M, Ferreira SO, Marega Junior E. Growth process and grain boundary defects in Er doped BaTiO3 processed by EB-PVD: a study by XRD, FTIR, SEM and AFM [Internet]. Applied Surface Science. 2019 ; No 2019 982-993.[citado 2024 nov. 06 ] Available from: https://doi.org/10.1016/j.apsusc.2019.07.003
