Reis, Igor; Moulin, Emmanuel 
; Viana, Aion
Source: Proceedings of Science. Conference titles: International Cosmic Ray Conference - ICRC. Unidade: IFSC
Subjects: ASTROFÍSICA, RAIOS CÓSMICOS, MATÉRIA ESCURA
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REIS, Igor e MOULIN, Emmanuel e VIANA, Aion. Sensitivity to keV-MeV dark matter from cosmic-ray scattering with current and the upcoming ground-based arrays CTA and SWGO. Proceedings of Science. Trieste: Scuola Internazionale Superiore di Studi Avanzati - SISSA. Disponível em: https://doi.org/10.22323/1.444.1408. Acesso em: 14 nov. 2024. , 2024APA
Reis, I., Moulin, E., & Viana, A. (2024). Sensitivity to keV-MeV dark matter from cosmic-ray scattering with current and the upcoming ground-based arrays CTA and SWGO. Proceedings of Science. Trieste: Scuola Internazionale Superiore di Studi Avanzati - SISSA. doi:10.22323/1.444.1408NLM
Reis I, Moulin E, Viana A. Sensitivity to keV-MeV dark matter from cosmic-ray scattering with current and the upcoming ground-based arrays CTA and SWGO [Internet]. Proceedings of Science. 2024 ; 444 1408-1-1408-8.[citado 2024 nov. 14 ] Available from: https://doi.org/10.22323/1.444.1408Vancouver
Reis I, Moulin E, Viana A. Sensitivity to keV-MeV dark matter from cosmic-ray scattering with current and the upcoming ground-based arrays CTA and SWGO [Internet]. Proceedings of Science. 2024 ; 444 1408-1-1408-8.[citado 2024 nov. 14 ] Available from: https://doi.org/10.22323/1.444.1408
