Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA (2024)
Conference titles: IEEE 25th Latin American Test Symposium (LATS). Unidade: IFSubjects: FÍSICA DE PARTÍCULAS, RADIAÇÃO IONIZANTE, ACELERADOR DE PARTÍCULAS, ÍONS
ABNT
COSTA, Victor O. et al. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. 2024, Anais.. Piscataway, NJ: IEEE, 2024. Disponível em: https://doi.org/10.1109/LATS62223.2024.10534591. Acesso em: 12 fev. 2025.APA
Costa, V. O., Benevenuti, F., Menezes, R., Sato, L. S., Loures, L., Kastensmidt, F. L., et al. (2024). Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA. In . Piscataway, NJ: IEEE. doi:10.1109/LATS62223.2024.10534591NLM
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 fev. 12 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591Vancouver
Costa VO, Benevenuti F, Menezes R, Sato LS, Loures L, Kastensmidt FL, Added N, Alberton S, Aguiar VAP, Medina NH. Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA [Internet]. 2024 ;[citado 2025 fev. 12 ] Available from: https://doi.org/10.1109/LATS62223.2024.10534591