Source: Materialia. Unidades: EP, IF
Subjects: DIFRAÇÃO POR RAIOS X, TENSÃO RESIDUAL, ESTANHO
ABNT
MISCIONE, Juan Manuel Costa et al. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation. Materialia, v. 28, p. 17 , 2023Tradução . . Disponível em: https://doi.org/10.1016/j.mtla.2023.101715. Acesso em: 02 jun. 2023.APA
Miscione, J. M. C., Silva, F. C. da, Marcondes, M. L., Petrilli, H. M., & Schön, C. G. (2023). Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation. Materialia, 28, 17 . doi:https://doi.org/10.1016/j.mtla.2023.101715NLM
Miscione JMC, Silva FC da, Marcondes ML, Petrilli HM, Schön CG. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation [Internet]. Materialia. 2023 ; 28 17 .[citado 2023 jun. 02 ] Available from: https://doi.org/10.1016/j.mtla.2023.101715Vancouver
Miscione JMC, Silva FC da, Marcondes ML, Petrilli HM, Schön CG. Evaluating residual stresses in compositionally graded TiN films via ab initio and Rietveld simulation [Internet]. Materialia. 2023 ; 28 17 .[citado 2023 jun. 02 ] Available from: https://doi.org/10.1016/j.mtla.2023.101715