Filtros : "World Congress on Industrial Process Tomography - WCIPT" Removido: "Silva, M. J." Limpar


  • Source: Proceedings. Conference titles: World Congress on Industrial Process Tomography - WCIPT. Unidade: EESC

    Subjects: IMPEDÂNCIA ELÉTRICA, ESCOAMENTO BIFÁSICO, REOLOGIA, ENGENHARIA MECÂNICA

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    • ABNT

      HERVIEU, Eric e SELEGHIM JUNIOR, Paulo. Direct imaging of two-phase flows by electrical impedance measurements. 1999, Anais.. Manchester, UK: ISIPT, 1999. Disponível em: https://repositorio.usp.br/directbitstream/12502ad1-0405-489f-b0e8-ad27fd20accd/OK___trabalho%2052%20-%20Direct%20Imaging%20of%20Two-Phase%20Flows%20by%20Electrical%20Impedance%20Measurements%20%281st%20World%20Congress%20on%20Process%20Tomography%2C%201999%29_removed.pdf. Acesso em: 11 set. 2024.
    • APA

      Hervieu, E., & Seleghim Junior, P. (1999). Direct imaging of two-phase flows by electrical impedance measurements. In Proceedings. Manchester, UK: ISIPT. Recuperado de https://repositorio.usp.br/directbitstream/12502ad1-0405-489f-b0e8-ad27fd20accd/OK___trabalho%2052%20-%20Direct%20Imaging%20of%20Two-Phase%20Flows%20by%20Electrical%20Impedance%20Measurements%20%281st%20World%20Congress%20on%20Process%20Tomography%2C%201999%29_removed.pdf
    • NLM

      Hervieu E, Seleghim Junior P. Direct imaging of two-phase flows by electrical impedance measurements [Internet]. Proceedings. 1999 ;[citado 2024 set. 11 ] Available from: https://repositorio.usp.br/directbitstream/12502ad1-0405-489f-b0e8-ad27fd20accd/OK___trabalho%2052%20-%20Direct%20Imaging%20of%20Two-Phase%20Flows%20by%20Electrical%20Impedance%20Measurements%20%281st%20World%20Congress%20on%20Process%20Tomography%2C%201999%29_removed.pdf
    • Vancouver

      Hervieu E, Seleghim Junior P. Direct imaging of two-phase flows by electrical impedance measurements [Internet]. Proceedings. 1999 ;[citado 2024 set. 11 ] Available from: https://repositorio.usp.br/directbitstream/12502ad1-0405-489f-b0e8-ad27fd20accd/OK___trabalho%2052%20-%20Direct%20Imaging%20of%20Two-Phase%20Flows%20by%20Electrical%20Impedance%20Measurements%20%281st%20World%20Congress%20on%20Process%20Tomography%2C%201999%29_removed.pdf

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