Machine learning testing: error, fault, or failure? an ontological approach (2025)
Source: Lecture Notes in Networks and Systems. Conference titles: Iberian Conference on Information Systems and Technologies - CISTI. Unidade: IME
Subjects: APRENDIZADO COMPUTACIONAL, INTELIGÊNCIA ARTIFICIAL, ONTOLOGIAS
ABNT
MELO, Ana Cristina Vieira de. Machine learning testing: error, fault, or failure? an ontological approach. Lecture Notes in Networks and Systems. Cham: Springer. Disponível em: https://link.springer.com/series/15179. Acesso em: 07 out. 2025. , 2025APA
Melo, A. C. V. de. (2025). Machine learning testing: error, fault, or failure? an ontological approach. Lecture Notes in Networks and Systems. Cham: Springer. Recuperado de https://link.springer.com/series/15179NLM
Melo ACV de. Machine learning testing: error, fault, or failure? an ontological approach [Internet]. Lecture Notes in Networks and Systems. 2025 ;[citado 2025 out. 07 ] Available from: https://link.springer.com/series/15179Vancouver
Melo ACV de. Machine learning testing: error, fault, or failure? an ontological approach [Internet]. Lecture Notes in Networks and Systems. 2025 ;[citado 2025 out. 07 ] Available from: https://link.springer.com/series/15179