Mutation testing applied to validate SDL specifications (2004)
Sugeta, Tatiana; Maldonado, José Carlos 
; Wong, W Eric
Source: Proceedings. Conference titles: IFIP International Conference, TestCom 2004. Unidade: ICMC
Assunto: ENGENHARIA DE SOFTWARE
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ABNT
SUGETA, Tatiana e MALDONADO, José Carlos e WONG, W Eric. Mutation testing applied to validate SDL specifications. 2004, Anais.. Luxemburgo: Springer, 2004. . Acesso em: 01 nov. 2024.APA
Sugeta, T., Maldonado, J. C., & Wong, W. E. (2004). Mutation testing applied to validate SDL specifications. In Proceedings. Luxemburgo: Springer.NLM
Sugeta T, Maldonado JC, Wong WE. Mutation testing applied to validate SDL specifications. Proceedings. 2004 ;[citado 2024 nov. 01 ]Vancouver
Sugeta T, Maldonado JC, Wong WE. Mutation testing applied to validate SDL specifications. Proceedings. 2004 ;[citado 2024 nov. 01 ]
