ReP USP - Resultado da busca

Trabalho de evento
Characteristics of silicon nitride films deposited by inductively coulped plasma CVD (2000)
Zambom, Luís da Silva ; Mansano, Ronaldo Domingues ; Furlan, Rogério
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
ZAMBOM, Luís da Silva e MANSANO, Ronaldo Domingues e FURLAN, Rogério. Characteristics of silicon nitride films deposited by inductively coulped plasma CVD. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Zambom, L. da S., Mansano, R. D., & Furlan, R. (2000). Characteristics of silicon nitride films deposited by inductively coulped plasma CVD. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Zambom L da S, Mansano RD, Furlan R. Characteristics of silicon nitride films deposited by inductively coulped plasma CVD. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Zambom L da S, Mansano RD, Furlan R. Characteristics of silicon nitride films deposited by inductively coulped plasma CVD. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence (2000)
Nicolett, Aparecido Sirley; Martino, João Antonio ; Simoen, Eddy ; Claeys, Cor
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
NICOLETT, Aparecido Sirley et al. Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Nicolett, A. S., Martino, J. A., Simoen, E., & Claeys, C. (2000). Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Nicolett AS, Martino JA, Simoen E, Claeys C. Extraction of the silicon film trickness on fully depleted SOI nMOSFETs using the back gate voltage influence. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Micromechanical structures development to concentrate hydrocarbons from air (2000)
Silva, Maria Lucia Pereira da; Furlan, Rogério ; Souza, Silvana G.
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
SILVA, Maria Lucia Pereira da e FURLAN, Rogério e SOUZA, Silvana G. Micromechanical structures development to concentrate hydrocarbons from air. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Silva, M. L. P. da, Furlan, R., & Souza, S. G. (2000). Micromechanical structures development to concentrate hydrocarbons from air. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Silva MLP da, Furlan R, Souza SG. Micromechanical structures development to concentrate hydrocarbons from air. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Silva MLP da, Furlan R, Souza SG. Micromechanical structures development to concentrate hydrocarbons from air. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Mechanical simulation of silicon microprobes (2000)
Leminski, Roberto; Fontes, Marcelo Bariatto Andrade; Furlan, Rogério
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
LEMINSKI, Roberto e FONTES, Marcelo Bariatto Andrade e FURLAN, Rogério. Mechanical simulation of silicon microprobes. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Leminski, R., Fontes, M. B. A., & Furlan, R. (2000). Mechanical simulation of silicon microprobes. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Leminski R, Fontes MBA, Furlan R. Mechanical simulation of silicon microprobes. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Leminski R, Fontes MBA, Furlan R. Mechanical simulation of silicon microprobes. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Fabrication of silicon probes for biosensors (2000)
Fontes, Marcelo Bariatto Andrade; Furlan, Rogério ; Santiago-Avilés, Jorge Juan ; Mansano, Ronaldo Domingues
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
FONTES, Marcelo Bariatto Andrade et al. Fabrication of silicon probes for biosensors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Fontes, M. B. A., Furlan, R., Santiago-Avilés, J. J., & Mansano, R. D. (2000). Fabrication of silicon probes for biosensors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Fontes MBA, Furlan R, Santiago-Avilés JJ, Mansano RD. Fabrication of silicon probes for biosensors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Fontes MBA, Furlan R, Santiago-Avilés JJ, Mansano RD. Fabrication of silicon probes for biosensors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Microfluidic devices for liquid flow control (2000)
Simões, Eliphas Wagner; Furlan, Rogério ; Choi, Dong Ho
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
SIMÕES, Eliphas Wagner e FURLAN, Rogério e CHOI, Dong Ho. Microfluidic devices for liquid flow control. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Simões, E. W., Furlan, R., & Choi, D. H. (2000). Microfluidic devices for liquid flow control. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Simões EW, Furlan R, Choi DH. Microfluidic devices for liquid flow control. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Simões EW, Furlan R, Choi DH. Microfluidic devices for liquid flow control. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Platinization and microelectrode impedance monitoring by Internet (2000)
Fernandez, Rodrigo O.; Peixoto, Nathalia; Ramírez Fernandez, Francisco Javier
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
FERNANDEZ, Rodrigo O. e PEIXOTO, Nathalia e RAMÍREZ FERNANDEZ, Francisco Javier. Platinization and microelectrode impedance monitoring by Internet. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Fernandez, R. O., Peixoto, N., & Ramírez Fernandez, F. J. (2000). Platinization and microelectrode impedance monitoring by Internet. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Fernandez RO, Peixoto N, Ramírez Fernandez FJ. Platinization and microelectrode impedance monitoring by Internet. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Fernandez RO, Peixoto N, Ramírez Fernandez FJ. Platinization and microelectrode impedance monitoring by Internet. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors (2000)
Araújo, Hugo Puertas de; Santos Filho, Sebastião Gomes dos
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
ARAÚJO, Hugo Puertas de e SANTOS FILHO, Sebastião Gomes dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Araújo, H. P. de, & Santos Filho, S. G. dos. (2000). Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Araújo HP de, Santos Filho SG dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Araújo HP de, Santos Filho SG dos. Electrical simulations of gate-controlled diodes in order to show their feasibility as luminous radiation sensors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
SIPOS thin films deposition process for power devices passivation (2000)
Ferreira, Eduardo dos Santos; Morimoto, Nilton Itiro ; Marzano, Wanderley
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
FERREIRA, Eduardo dos Santos e MORIMOTO, Nilton Itiro e MARZANO, Wanderley. SIPOS thin films deposition process for power devices passivation. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Ferreira, E. dos S., Morimoto, N. I., & Marzano, W. (2000). SIPOS thin films deposition process for power devices passivation. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Ferreira E dos S, Morimoto NI, Marzano W. SIPOS thin films deposition process for power devices passivation. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Ferreira E dos S, Morimoto NI, Marzano W. SIPOS thin films deposition process for power devices passivation. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Quartz microbalance as chemical gas sensor (2000)
Churra, Roberto; Cassaniga, Rafael Franchi; Perez Lisboa, Mauricio Oscar; Ramírez Fernandez, Francisco Javier
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
CHURRA, Roberto et al. Quartz microbalance as chemical gas sensor. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Churra, R., Cassaniga, R. F., Perez Lisboa, M. O., & Ramírez Fernandez, F. J. (2000). Quartz microbalance as chemical gas sensor. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Churra R, Cassaniga RF, Perez Lisboa MO, Ramírez Fernandez FJ. Quartz microbalance as chemical gas sensor. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Churra R, Cassaniga RF, Perez Lisboa MO, Ramírez Fernandez FJ. Quartz microbalance as chemical gas sensor. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Direct synthesis of speed-independent circuits using multi-burst graph specification (2000)
Oliveira, Duarte Lopes de; Strum, Marius; Wang, Jiang Chau ; Cunha, Wagner C.
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
OLIVEIRA, Duarte Lopes de et al. Direct synthesis of speed-independent circuits using multi-burst graph specification. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Oliveira, D. L. de, Strum, M., Wang, J. C., & Cunha, W. C. (2000). Direct synthesis of speed-independent circuits using multi-burst graph specification. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Oliveira DL de, Strum M, Wang JC, Cunha WC. Direct synthesis of speed-independent circuits using multi-burst graph specification. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Oliveira DL de, Strum M, Wang JC, Cunha WC. Direct synthesis of speed-independent circuits using multi-burst graph specification. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Analysis of the surface roughness and surface particle concentration using a new technique: integrated angle resolved LASER scattering (IARLS) (2000)
Souza Filho, José Cândido de; Santos Filho, Sebastião Gomes dos
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
SOUZA FILHO, José Cândido de e SANTOS FILHO, Sebastião Gomes dos. Analysis of the surface roughness and surface particle concentration using a new technique: integrated angle resolved LASER scattering (IARLS). 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Souza Filho, J. C. de, & Santos Filho, S. G. dos. (2000). Analysis of the surface roughness and surface particle concentration using a new technique: integrated angle resolved LASER scattering (IARLS). In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Souza Filho JC de, Santos Filho SG dos. Analysis of the surface roughness and surface particle concentration using a new technique: integrated angle resolved LASER scattering (IARLS). SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Souza Filho JC de, Santos Filho SG dos. Analysis of the surface roughness and surface particle concentration using a new technique: integrated angle resolved LASER scattering (IARLS). SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Design and implementation of a flow microsensor by using silicon microelectronics technology (2000)
Rodrigues, Roberto Jacobe; Furlan, Rogério
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
RODRIGUES, Roberto Jacobe e FURLAN, Rogério. Design and implementation of a flow microsensor by using silicon microelectronics technology. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Rodrigues, R. J., & Furlan, R. (2000). Design and implementation of a flow microsensor by using silicon microelectronics technology. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Rodrigues RJ, Furlan R. Design and implementation of a flow microsensor by using silicon microelectronics technology. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Rodrigues RJ, Furlan R. Design and implementation of a flow microsensor by using silicon microelectronics technology. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Partial dielectric breakdown in MOS gate oxide grown by RTO (2000)
Nogueira, Willian Aurélio; Santos Filho, Sebastião Gomes dos
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
NOGUEIRA, Willian Aurélio e SANTOS FILHO, Sebastião Gomes dos. Partial dielectric breakdown in MOS gate oxide grown by RTO. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Nogueira, W. A., & Santos Filho, S. G. dos. (2000). Partial dielectric breakdown in MOS gate oxide grown by RTO. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Nogueira WA, Santos Filho SG dos. Partial dielectric breakdown in MOS gate oxide grown by RTO. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Nogueira WA, Santos Filho SG dos. Partial dielectric breakdown in MOS gate oxide grown by RTO. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
RF electrical measurements in plasma processing reactors (2000)
Pisani, Marcelo B.; Verdonck, Patrick Bernard
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
PISANI, Marcelo B. e VERDONCK, Patrick Bernard. RF electrical measurements in plasma processing reactors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Pisani, M. B., & Verdonck, P. B. (2000). RF electrical measurements in plasma processing reactors. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Pisani MB, Verdonck PB. RF electrical measurements in plasma processing reactors. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Pisani MB, Verdonck PB. RF electrical measurements in plasma processing reactors. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs (2000)
Pavanello, Marcelo Antonio ; Martino, João Antonio ; Flandre, Denis
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
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ABNT
PAVANELLO, Marcelo Antonio e MARTINO, João Antonio e FLANDRE, Denis. Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Pavanello, M. A., Martino, J. A., & Flandre, D. (2000). Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Pavanello MA, Martino JA, Flandre D. Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Pavanello MA, Martino JA, Flandre D. Comparison of analog performance in conventional and graded-channel fully-depleted SOI MOSFETs. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors (2000)
Navia, Alan Rodrigo; Sonnenberg, Victor ; Marques, Angelo Eduardo Battistini; Santos Filho, Sebastião Gomes dos ; Martino, João Antonio
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
NAVIA, Alan Rodrigo et al. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Navia, A. R., Sonnenberg, V., Marques, A. E. B., Santos Filho, S. G. dos, & Martino, J. A. (2000). Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Navia AR, Sonnenberg V, Marques AEB, Santos Filho SG dos, Martino JA. Electrical characterization of thin nickel films obtained from electroless plating onto aluminum gate of MOS capacitors. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Analysis of microbean deflection due to capillary loading (2000)
Guimarães, Marcelo Silva; Furlan, Rogério
Source: SBMicro 2000 : proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
GUIMARÃES, Marcelo Silva e FURLAN, Rogério. Analysis of microbean deflection due to capillary loading. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Guimarães, M. S., & Furlan, R. (2000). Analysis of microbean deflection due to capillary loading. In SBMicro 2000 : proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Guimarães MS, Furlan R. Analysis of microbean deflection due to capillary loading. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Guimarães MS, Furlan R. Analysis of microbean deflection due to capillary loading. SBMicro 2000 : proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures (2000)
Bellodi, Marcello; Iniguez, Benjamin; Raynaud, Cristine; Flandre, Denis ; Martino, João Antonio
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BELLODI, Marcello et al. Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Bellodi, M., Iniguez, B., Raynaud, C., Flandre, D., & Martino, J. A. (2000). Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Bellodi M, Iniguez B, Raynaud C, Flandre D, Martino JA. Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Bellodi M, Iniguez B, Raynaud C, Flandre D, Martino JA. Study of the deep-submicron SOI MOSFET leakage current behavior at high temperatures. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Trabalho de evento
A new experimental procedure to obtain the refractive index of MOS gate oxynitrides grown by RTP in N2O atmosphere (2000)
Toquetti, Leandro Zeidan; Santos Filho, Sebastião Gomes dos
Source: SBMicro 2000: proceedings. Conference title: International Conference on Microelectronics and Packaging. Unidade: EP
Subject: CIRCUITOS INTEGRADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
TOQUETTI, Leandro Zeidan e SANTOS FILHO, Sebastião Gomes dos. A new experimental procedure to obtain the refractive index of MOS gate oxynitrides grown by RTP in N2O atmosphere. 2000, Anais.. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP, 2000. . Acesso em: 29 jun. 2022.
APA
Toquetti, L. Z., & Santos Filho, S. G. dos. (2000). A new experimental procedure to obtain the refractive index of MOS gate oxynitrides grown by RTP in N2O atmosphere. In SBMicro 2000: proceedings. Manaus: SBMicro/UA/UFRGS/UNICAMP/USP.
NLM
Toquetti LZ, Santos Filho SG dos. A new experimental procedure to obtain the refractive index of MOS gate oxynitrides grown by RTP in N2O atmosphere. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]
Vancouver
Toquetti LZ, Santos Filho SG dos. A new experimental procedure to obtain the refractive index of MOS gate oxynitrides grown by RTP in N2O atmosphere. SBMicro 2000: proceedings. 2000 ;[citado 2022 jun. 29 ]

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