Source: Anais. Conference titles: Congresso da Sociedade Brasileira de Microscopia e Microanálise. Unidades: FO, EP
Subjects: MICROSCOPIA ELETRÔNICA DE VARREDURA (FERRAMENTAS), MATERIAIS DENTÁRIOS (AVALIAÇÃO;ESTIMATIVA)
ABNT
BRUMATTI, Mariane et al. Scanning electron microscopy as a tool for failure pattern evaluation in the dentin/resin composite interface. 2009, Anais.. Belo Horizonte: SBMM, 2009. Disponível em: https://repositorio.usp.br/directbitstream/7dd88ae4-4879-4c50-9803-3552fc526462/Kahn-2009-Scanning_electron_microscopy_as_a_tool_for_failure_-_resumo.pdf. Acesso em: 25 abr. 2026.APA
Brumatti, M., Moraes, A. G. V., Francci, C. E., Zanchetta, L. de M., & Kahn, H. (2009). Scanning electron microscopy as a tool for failure pattern evaluation in the dentin/resin composite interface. In Anais. Belo Horizonte: SBMM. Recuperado de https://repositorio.usp.br/directbitstream/7dd88ae4-4879-4c50-9803-3552fc526462/Kahn-2009-Scanning_electron_microscopy_as_a_tool_for_failure_-_resumo.pdfNLM
Brumatti M, Moraes AGV, Francci CE, Zanchetta L de M, Kahn H. Scanning electron microscopy as a tool for failure pattern evaluation in the dentin/resin composite interface [Internet]. Anais. 2009 ;[citado 2026 abr. 25 ] Available from: https://repositorio.usp.br/directbitstream/7dd88ae4-4879-4c50-9803-3552fc526462/Kahn-2009-Scanning_electron_microscopy_as_a_tool_for_failure_-_resumo.pdfVancouver
Brumatti M, Moraes AGV, Francci CE, Zanchetta L de M, Kahn H. Scanning electron microscopy as a tool for failure pattern evaluation in the dentin/resin composite interface [Internet]. Anais. 2009 ;[citado 2026 abr. 25 ] Available from: https://repositorio.usp.br/directbitstream/7dd88ae4-4879-4c50-9803-3552fc526462/Kahn-2009-Scanning_electron_microscopy_as_a_tool_for_failure_-_resumo.pdf
