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  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: RADIAÇÃO SINCROTRON, CRISTALOGRAFIA DE RAIOS X, NANOPARTÍCULAS, TERMODINÂMICA, ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS

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      KELLERMANN, G.; PEREIRA, F. L. C.; CRAIEVICH, A. F. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, Chester, v. 53, n. 2, p. 455-463, 2020. Disponível em: < https://doi.org/10.1107/S1600576720002101 > DOI: 10.1107/S1600576720002101.
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      Kellermann, G., Pereira, F. L. C., & Craievich, A. F. (2020). Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique. Journal of Applied Crystallography, 53( 2), 455-463. doi:10.1107/S1600576720002101
    • NLM

      Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.Available from: https://doi.org/10.1107/S1600576720002101
    • Vancouver

      Kellermann G, Pereira FLC, Craievich AF. Determination of the melting temperature of spherical nanoparticles in dilute solution as a function of their radius by exclusively using the small-angle X-ray scattering technique [Internet]. Journal of Applied Crystallography. 2020 ; 53( 2): 455-463.Available from: https://doi.org/10.1107/S1600576720002101
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, NANOPARTÍCULAS, MICROSCOPIA ELETRÔNICA

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      GORGESKI, A; CRAIEVICH, Aldo Felix; CORREA, L M; MONTORO, Luciano Andrey; KELLERMANN, Guinther. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography, Chester, v. 51, p. 395-405, 2018. DOI: 10.1107/S1600576718001462.
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      Gorgeski, A., Craievich, A. F., Correa, L. M., Montoro, L. A., & Kellermann, G. (2018). In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography, 51, 395-405. doi:10.1107/S1600576718001462
    • NLM

      Gorgeski A, Craievich AF, Correa LM, Montoro LA, Kellermann G. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography. 2018 ; 51 395-405.
    • Vancouver

      Gorgeski A, Craievich AF, Correa LM, Montoro LA, Kellermann G. In situ study of the kinetics of growth of Pb nanoparticles embedded in a PbO–B2O3 glass. Journal of Applied Crystallography. 2018 ; 51 395-405.
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, RADIAÇÃO SINCROTRON

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      MORELHAO, Sergio Luiz; REMÉDIOS, Claudio Marcio Rocha; CALLIGARIS, Guilherme Andrade; NISBET, Gareth. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, Copenhagen, v. 50, n. 3, p. 689-700, 2017. Disponível em: < http://doi.org/10.1107/S1600576717004757 > DOI: 10.1107/S1600576717004757.
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      Morelhao, S. L., Remédios, C. M. R., Calligaris, G. A., & Nisbet, G. (2017). X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements. Journal of Applied Crystallography, 50( 3), 689-700. doi:10.1107/S1600576717004757
    • NLM

      Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.Available from: http://doi.org/10.1107/S1600576717004757
    • Vancouver

      Morelhao SL, Remédios CMR, Calligaris GA, Nisbet G. X-ray dynamical diffraction in amino acid crystals: a step towards improving structural resolution of biological molecules via physical phase measurements [Internet]. Journal of Applied Crystallography. 2017 ; 50( 3): 689-700.Available from: http://doi.org/10.1107/S1600576717004757
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, MATERIAIS NANOESTRUTURADOS

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      MORELHAO, Sergio Luiz; FORNARI, Celso I; RAPPL, Paulo Henrique de Oliveira; ABRAMOF, Eduardo. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, Copenhagen, v. 50, n. 2, p. 399-410, 2017. Disponível em: < http://doi.org/10.1107/S1600576717000760 > DOI: 10.1107/S1600576717000760.
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      Morelhao, S. L., Fornari, C. I., Rappl, P. H. de O., & Abramof, E. (2017). Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis. Journal of Applied Crystallography, 50( 2), 399-410. doi:10.1107/S1600576717000760
    • NLM

      Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.Available from: http://doi.org/10.1107/S1600576717000760
    • Vancouver

      Morelhao SL, Fornari CI, Rappl PH de O, Abramof E. Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis [Internet]. Journal of Applied Crystallography. 2017 ; 50( 2): 399-410.Available from: http://doi.org/10.1107/S1600576717000760
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: NANOPARTÍCULAS, RAIOS X

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      DEGENHARDT, Hermann Franz; KELLERMANN, Guinther; CRAIEVICH, Aldo Felix. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range. Journal of Applied Crystallography, Chester, v. 50, p. 1590-1600, 2017. Disponível em: < http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7 > DOI: 10.1107/S1600576717012997.
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      Degenhardt, H. F., Kellermann, G., & Craievich, A. F. (2017). Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range. Journal of Applied Crystallography, 50, 1590-1600. doi:10.1107/S1600576717012997
    • NLM

      Degenhardt HF, Kellermann G, Craievich AF. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range [Internet]. Journal of Applied Crystallography. 2017 ; 50 1590-1600.Available from: http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7
    • Vancouver

      Degenhardt HF, Kellermann G, Craievich AF. Melting and freezing temperatures of confined 'BI' nanoparticles over a wide size range [Internet]. Journal of Applied Crystallography. 2017 ; 50 1590-1600.Available from: http://buscatextual.cnpq.br/buscatextual/visualizacv.do?id=K4781554P7
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: SEMICONDUTORES, RAIOS X

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      DOMAGALA, Jaroslaw Z.; SARZYNSKI, Marcin; MAZDZIARZ, Marcin; et al. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, Chester, v. 49, n. ju 2016, p. 798-805, 2016. DOI: 10.1038/srep28128.
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      Domagala, J. Z., Sarzynski, M., Mazdziarz, M., Dluzewski, P., Leszczynski, M., & Morelhao, S. L. (2016). Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography, 49( ju 2016), 798-805. doi:10.1038/srep28128
    • NLM

      Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.
    • Vancouver

      Domagala JZ, Sarzynski M, Mazdziarz M, Dluzewski P, Leszczynski M, Morelhao SL. Hybrid reciprocal lattice: application to layer stress determination in 'GA''AL''N'/'GA''N'(0001) systems with patterned substrates. Journal of Applied Crystallography. 2016 ; 49( ju 2016): 798-805.
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: RAIOS X, MACROMOLÉCULA

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      ALVES, Cassio; PEDERSEN, Jan Skov; OLIVEIRA, Cristiano Luis Pinto de. Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, Hoboken, v. 47, n. ja 2014, p. 84-94, 2014. DOI: 10.1107/s1600576713028549.
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      Alves, C., Pedersen, J. S., & Oliveira, C. L. P. de. (2014). Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography, 47( ja 2014), 84-94. doi:10.1107/s1600576713028549
    • NLM

      Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.
    • Vancouver

      Alves C, Pedersen JS, Oliveira CLP de. Modelling of high-symmetry nanoscale particles by small-angle scattering. Journal of Applied Crystallography. 2014 ; 47( ja 2014): 84-94.
  • Source: Journal of Applied Crystallography. Unidade: IFSC

    Subjects: CRISTALOGRAFIA, RAIOS X

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      AMIRKHANYAN, Zohrab G.; REMÉDIOS, Claúdio M. R.; MASCARENHAS, Yvonne Primerano; MORELHÃO, Sérgio L. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, Chester, v. 47, p. 160-165, 2014. Disponível em: < http://dx.doi.org/10.1107/S1600576713028677 > DOI: 10.1107/S1600576713028677.
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      Amirkhanyan, Z. G., Remédios, C. M. R., Mascarenhas, Y. P., & Morelhão, S. L. (2014). Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning. Journal of Applied Crystallography, 47, 160-165. doi:10.1107/S1600576713028677
    • NLM

      Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.Available from: http://dx.doi.org/10.1107/S1600576713028677
    • Vancouver

      Amirkhanyan ZG, Remédios CMR, Mascarenhas YP, Morelhão SL. Analyzing structure factor phases in pure and doped single crystals by synchrotron X-ray Renninger scanning [Internet]. Journal of Applied Crystallography. 2014 ; 47 160-165.Available from: http://dx.doi.org/10.1107/S1600576713028677
  • Source: Journal of Applied Crystallography. Unidade: BIOENERGIA

    Subjects: CELULOSE, CRISTALOGRAFIA ESTRUTURAL, DIFRAÇÃO POR RAIOS X

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      OLIVEIRA, Rafael P; DRIEMEIER, Carlos Eduardo. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose. Journal of Applied Crystallography, Oxford, v. 46, p. 1196-1210, 2013. Disponível em: < https://onlinelibrary.wiley.com/doi/epdf/10.1107/S0021889813014805?sentby=iucr > DOI: 10.1107/S0021889813014805.
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      Oliveira, R. P., & Driemeier, C. E. (2013). CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose. Journal of Applied Crystallography, 46, 1196-1210. doi:10.1107/S0021889813014805
    • NLM

      Oliveira RP, Driemeier CE. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose [Internet]. Journal of Applied Crystallography. 2013 ; 46 1196-1210.Available from: https://onlinelibrary.wiley.com/doi/epdf/10.1107/S0021889813014805?sentby=iucr
    • Vancouver

      Oliveira RP, Driemeier CE. CRAFS: a model to analyze two-dimensional X-ray diffraction patterns of plant cellulose [Internet]. Journal of Applied Crystallography. 2013 ; 46 1196-1210.Available from: https://onlinelibrary.wiley.com/doi/epdf/10.1107/S0021889813014805?sentby=iucr
  • Source: Journal of Applied Crystallography. Unidade: BIOENERGIA

    Subjects: CELULOSE, CRISTALOGRAFIA ESTRUTURAL, DIFRAÇÃO POR RAIOS X

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      DRIEMEIER, Carlos Eduardo; CALLIGARIS, Guilherme A. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials. Journal of Applied Crystallography, Hoboken, v. 44, p. 184-192, 2011. Disponível em: < https://onlinelibrary.wiley.com/iucr/doi/10.1107/S0021889810043955 > DOI: 10.1107/S0021889810043955.
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      Driemeier, C. E., & Calligaris, G. A. (2011). Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials. Journal of Applied Crystallography, 44, 184-192. doi:10.1107/S0021889810043955
    • NLM

      Driemeier CE, Calligaris GA. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials [Internet]. Journal of Applied Crystallography. 2011 ; 44 184-192.Available from: https://onlinelibrary.wiley.com/iucr/doi/10.1107/S0021889810043955
    • Vancouver

      Driemeier CE, Calligaris GA. Theoretical and experimental developments for accurate determination of crystallinity of cellulose I materials [Internet]. Journal of Applied Crystallography. 2011 ; 44 184-192.Available from: https://onlinelibrary.wiley.com/iucr/doi/10.1107/S0021889810043955
  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: RAIOS X

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      JENSEN, Grethe Vestergaard; OLIVEIRA, Cristiano L P. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering. Journal of Applied Crystallography, Copenhagen, v. 44, n. 3, p. 473-482, 2011. Disponível em: < http://journals.iucr.org/j/issues/2011/03/00/ce5100/ce5100.pdf > DOI: 10.1107/s0021889811013343.
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      Jensen, G. V., & Oliveira, C. L. P. (2011). Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering. Journal of Applied Crystallography, 44( 3), 473-482. doi:10.1107/s0021889811013343
    • NLM

      Jensen GV, Oliveira CLP. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering [Internet]. Journal of Applied Crystallography. 2011 ; 44( 3): 473-482.Available from: http://journals.iucr.org/j/issues/2011/03/00/ce5100/ce5100.pdf
    • Vancouver

      Jensen GV, Oliveira CLP. Structure of PEP-PEO block copolymer micelles: exploiting the complementarity of small-angle X-ray scattering and static light scattering [Internet]. Journal of Applied Crystallography. 2011 ; 44( 3): 473-482.Available from: http://journals.iucr.org/j/issues/2011/03/00/ce5100/ce5100.pdf
  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: RAIOS X

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      MORELHÃO, Sérgio L; FREITAS, Raul O. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, Copenhagen, v. fe 2011, n. 1, p. 93-101, 2011. DOI: 10.1107/s0021889810042391.
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      Morelhão, S. L., & Freitas, R. O. (2011). X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography, fe 2011( 1), 93-101. doi:10.1107/s0021889810042391
    • NLM

      Morelhão SL, Freitas RO. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.
    • Vancouver

      Morelhão SL, Freitas RO. X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals. Journal of Applied Crystallography. 2011 ; fe 2011( 1): 93-101.
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: FILMES FINOS, DIFRAÇÃO POR RAIOS X, SEMICONDUTORES

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      KELLERMANN, Guinther; RODRIGUEZ, Eugenio; JIMENEZ, Ernesto; et al. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, Washington, DC, v. 43, p. 385-393, 2010.
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      Kellermann, G., Rodriguez, E., Jimenez, E., Cesar, C. L., Barbosa, L. C., & Craievich, A. F. (2010). Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography, 43, 385-393.
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      Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography. 2010 ; 43 385-393.
    • Vancouver

      Kellermann G, Rodriguez E, Jimenez E, Cesar CL, Barbosa LC, Craievich AF. Structure of PbTe(`SiO IND.2´)/`SiO IND.2´ multilayers deposited on Si(111). Journal of Applied Crystallography. 2010 ; 43 385-393.
  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: DIFRAÇÃO POR RAIOS X

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      ACUNÃ, Leandro M; LAMAS, Diego G; FUENTES, Rodolfo O; et al. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography, singapore, v. 43, n. 2, p. 227-236, 2010.
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      Acunã, L. M., Lamas, D. G., Fuentes, R. O., Fábregas,, Fantini, M. C. de A., Craievich, A. F., & Prado, R. J. (2010). Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography, 43( 2), 227-236.
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      Acunã LM, Lamas DG, Fuentes RO, Fábregas, Fantini MC de A, Craievich AF, Prado RJ. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography. 2010 ; 43( 2): 227-236.
    • Vancouver

      Acunã LM, Lamas DG, Fuentes RO, Fábregas, Fantini MC de A, Craievich AF, Prado RJ. Local atomic structure in tetragonal pure `ZrO IND.2´ nanopowders. Journal of Applied Crystallography. 2010 ; 43( 2): 227-236.
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, SUPERFÍCIE FÍSICA, LUMINESCÊNCIA

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      SOUZA NETO, Narcizo M; RAMOS, Aline Y; TOLENTINO, Helio C N; MARTINS, Alessandro; SANTOS, A. D. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, Malden, v. 42, n. 6, p. 1158-1164, 2009. Disponível em: < http://www3.interscience.wiley.com/cgi-bin/fulltext/122687724/PDFSTART > DOI: 10.1107/s0021889809042678.
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      Souza Neto, N. M., Ramos, A. Y., Tolentino, H. C. N., Martins, A., & Santos, A. D. (2009). Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy. Journal of Applied Crystallography, 42( 6), 1158-1164. doi:10.1107/s0021889809042678
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      Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122687724/PDFSTART
    • Vancouver

      Souza Neto NM, Ramos AY, Tolentino HCN, Martins A, Santos AD. Depth-dependent local structures in thin films unraveled by grazing-incidence X-ray absorption spectroscopy [Internet]. Journal of Applied Crystallography. 2009 ; 42( 6): 1158-1164.Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/122687724/PDFSTART
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: DIFRAÇÃO POR RAIOS X, RADIAÇÃO SINCROTRON

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      FÁBREGAS, Ismael Oscar; LAMAS, Diego German; RECA, Noemi Elizabeth Walsoee de; et al. Synchrotron X-ray powder diffraction and extended X-ray absorption fine structure spectroscopy studies on nanocrystalline 'ZrO IND.2´- CaO solid solutions. Journal of Applied Crystallography, Oxford, v. 41, n. 4, p. 680-689, 2008. Disponível em: < http://www3.interscience.wiley.com/cgi-bin/fulltext/121392982/PDFSTART > DOI: 10.1107/s0021889808013046.
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      Fábregas, I. O., Lamas, D. G., Reca, N. E. W. de, Fantini, M. C. de A., Craievich, A. F., & Prado, R. J. (2008). Synchrotron X-ray powder diffraction and extended X-ray absorption fine structure spectroscopy studies on nanocrystalline 'ZrO IND.2´- CaO solid solutions. Journal of Applied Crystallography, 41( 4), 680-689. doi:10.1107/s0021889808013046
    • NLM

      Fábregas IO, Lamas DG, Reca NEW de, Fantini MC de A, Craievich AF, Prado RJ. Synchrotron X-ray powder diffraction and extended X-ray absorption fine structure spectroscopy studies on nanocrystalline 'ZrO IND.2´- CaO solid solutions [Internet]. Journal of Applied Crystallography. 2008 ; 41( 4): 680-689.Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/121392982/PDFSTART
    • Vancouver

      Fábregas IO, Lamas DG, Reca NEW de, Fantini MC de A, Craievich AF, Prado RJ. Synchrotron X-ray powder diffraction and extended X-ray absorption fine structure spectroscopy studies on nanocrystalline 'ZrO IND.2´- CaO solid solutions [Internet]. Journal of Applied Crystallography. 2008 ; 41( 4): 680-689.Available from: http://www3.interscience.wiley.com/cgi-bin/fulltext/121392982/PDFSTART
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: MATERIAIS (PROPRIEDADES MECÂNICAS), MICROSCOPIA ELETRÔNICA DE VARREDURA, DIFRAÇÃO POR RAIOS X

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      CASANOVA JUNIOR, Jorge R; LAMAS, Diego G; RECA, Noemi E Walsoe; et al. Structure of nanoporous zirconia-based powders synthesized by different gel-combustion routes. Journal of Applied Crystallography, Oxford, v. 40, p. S147-S152, 2007. Disponível em: < http://www.blackwell-synergy.com/doi/pdf/10.1107/S0021889806048382 > DOI: 10.1107/s0021889806048382.
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      Casanova Junior, J. R., Lamas, D. G., Reca, N. E. W., Lascalea, G. E., Kempf, R., Craievich, A. F., et al. (2007). Structure of nanoporous zirconia-based powders synthesized by different gel-combustion routes. Journal of Applied Crystallography, 40, S147-S152. doi:10.1107/s0021889806048382
    • NLM

      Casanova Junior JR, Lamas DG, Reca NEW, Lascalea GE, Kempf R, Craievich AF, Santilli CV, Fabregas IO. Structure of nanoporous zirconia-based powders synthesized by different gel-combustion routes [Internet]. Journal of Applied Crystallography. 2007 ; 40 S147-S152.Available from: http://www.blackwell-synergy.com/doi/pdf/10.1107/S0021889806048382
    • Vancouver

      Casanova Junior JR, Lamas DG, Reca NEW, Lascalea GE, Kempf R, Craievich AF, Santilli CV, Fabregas IO. Structure of nanoporous zirconia-based powders synthesized by different gel-combustion routes [Internet]. Journal of Applied Crystallography. 2007 ; 40 S147-S152.Available from: http://www.blackwell-synergy.com/doi/pdf/10.1107/S0021889806048382
  • Source: Journal of Applied Crystallography. Unidade: IF

    Assunto: DIFRAÇÃO POR RAIOS X

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    • ABNT

      MORELHÃO, Sérgio Luiz; DOMAGALA, Jarek Z. Hybrid reciprocal space for X-ray diffraction in epitaxic layers. Journal of Applied Crystallography, Oxford, v. 40, p. 546-551, 2007. Disponível em: < http://www.blackwell-synergy.com/doi/pdf/10.1107/S002188980701521X > DOI: 10.1107/s002188980701521x.
    • APA

      Morelhão, S. L., & Domagala, J. Z. (2007). Hybrid reciprocal space for X-ray diffraction in epitaxic layers. Journal of Applied Crystallography, 40, 546-551. doi:10.1107/s002188980701521x
    • NLM

      Morelhão SL, Domagala JZ. Hybrid reciprocal space for X-ray diffraction in epitaxic layers [Internet]. Journal of Applied Crystallography. 2007 ; 40 546-551.Available from: http://www.blackwell-synergy.com/doi/pdf/10.1107/S002188980701521X
    • Vancouver

      Morelhão SL, Domagala JZ. Hybrid reciprocal space for X-ray diffraction in epitaxic layers [Internet]. Journal of Applied Crystallography. 2007 ; 40 546-551.Available from: http://www.blackwell-synergy.com/doi/pdf/10.1107/S002188980701521X
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X

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      LAMAS, D G; FUENTES, R O; FABREGAS, I O; et al. Synchrotron X-ray diffraction study of the tetragonal-cubic phase boundary of nanocrystalline "ZrO IND.2" - "CeO IND.2" synthesized by a gel-combustion. Journal of Applied Crystallography, Oxford, v. 38, p. 867-873, 2005. Disponível em: < http://journals.iucr.org/j/issues/2005/06/00/issconts.html >.
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      Lamas, D. G., Fuentes, R. O., Fabregas, I. O., Fernández de Rapp, M. E., Lascalea, G. E., Casanova, J. R., et al. (2005). Synchrotron X-ray diffraction study of the tetragonal-cubic phase boundary of nanocrystalline "ZrO IND.2" - "CeO IND.2" synthesized by a gel-combustion. Journal of Applied Crystallography, 38, 867-873. Recuperado de http://journals.iucr.org/j/issues/2005/06/00/issconts.html
    • NLM

      Lamas DG, Fuentes RO, Fabregas IO, Fernández de Rapp ME, Lascalea GE, Casanova JR, Walsöe de Reca NE, Craievich AF. Synchrotron X-ray diffraction study of the tetragonal-cubic phase boundary of nanocrystalline "ZrO IND.2" - "CeO IND.2" synthesized by a gel-combustion [Internet]. Journal of Applied Crystallography. 2005 ; 38 867-873.Available from: http://journals.iucr.org/j/issues/2005/06/00/issconts.html
    • Vancouver

      Lamas DG, Fuentes RO, Fabregas IO, Fernández de Rapp ME, Lascalea GE, Casanova JR, Walsöe de Reca NE, Craievich AF. Synchrotron X-ray diffraction study of the tetragonal-cubic phase boundary of nanocrystalline "ZrO IND.2" - "CeO IND.2" synthesized by a gel-combustion [Internet]. Journal of Applied Crystallography. 2005 ; 38 867-873.Available from: http://journals.iucr.org/j/issues/2005/06/00/issconts.html
  • Source: Journal of Applied Crystallography. Unidade: IF

    Subjects: CRISTALOGRAFIA, DIFRAÇÃO POR RAIOS X

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      CHIAVACCI, L A; DAHMOUCHE, K; BRIOIS, V; et al. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography, Copenhagen, 2003. Disponível em: < http://journals.iucr.org/j/issues/2003/03/01/issconts.html > DOI: 10.1107/s0021889803000517.
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      Chiavacci, L. A., Dahmouche, K., Briois, V., Santilli, C. V., Zea Bermudez, V. de, Carlos, L. D., et al. (2003). Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites. Journal of Applied Crystallography. doi:10.1107/s0021889803000517
    • NLM

      Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;Available from: http://journals.iucr.org/j/issues/2003/03/01/issconts.html
    • Vancouver

      Chiavacci LA, Dahmouche K, Briois V, Santilli CV, Zea Bermudez V de, Carlos LD, Jolivet JP, Pulcinelli SH, Craievich AF. Small-angle X-ray scattering and X-ray absortpion near-edge structure study of iron-doped siloxane-polyoxyethylene nanocomposites [Internet]. Journal of Applied Crystallography. 2003 ;Available from: http://journals.iucr.org/j/issues/2003/03/01/issconts.html

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