Source: IEEE Transactions on Instrumentation and Measurement. Unidade: IFSC
Subjects: TERMOELETRICIDADE, CONDUTIVIDADE ELÉTRICA, FILMES FINOS
ABNT
PEREIRA, Gustavo Gonçalves Dalkiranis et al. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films. IEEE Transactions on Instrumentation and Measurement, v. 74, p. 1503706-1-1503706-6, 2025Tradução . . Disponível em: https://doi.org/10.1109/TIM.2025.3553254. Acesso em: 29 abr. 2025.APA
Pereira, G. G. D., Bocchi, J. H. C., Torres, B. B. M., Lopeandia-Fernández, A., Oliveira Junior, O. N. de, & Faria, G. C. (2025). Measurement system to determine the seebeck coefficient and electrical conductivity of thin films. IEEE Transactions on Instrumentation and Measurement, 74, 1503706-1-1503706-6. doi:10.1109/TIM.2025.3553254NLM
Pereira GGD, Bocchi JHC, Torres BBM, Lopeandia-Fernández A, Oliveira Junior ON de, Faria GC. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films [Internet]. IEEE Transactions on Instrumentation and Measurement. 2025 ; 74 1503706-1-1503706-6.[citado 2025 abr. 29 ] Available from: https://doi.org/10.1109/TIM.2025.3553254Vancouver
Pereira GGD, Bocchi JHC, Torres BBM, Lopeandia-Fernández A, Oliveira Junior ON de, Faria GC. Measurement system to determine the seebeck coefficient and electrical conductivity of thin films [Internet]. IEEE Transactions on Instrumentation and Measurement. 2025 ; 74 1503706-1-1503706-6.[citado 2025 abr. 29 ] Available from: https://doi.org/10.1109/TIM.2025.3553254