Filtros : "Microeletronics and Reliability" Limpar


  • Source: Microeletronics and Reliability. Unidades: IFSC, ICMC

    Subjects: ENGENHARIA ELÉTRICA, HARDWARE

    Acesso à fonteDOIHow to cite
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    • ABNT

      RODA, Valentin Obac e TRINDADE JUNIOR, Onofre. On the effect of power-line disturbances on microcomputer performance. Microeletronics and Reliability, v. 31, n. 2-3, p. 229-35, 1991Tradução . . Disponível em: https://doi.org/10.1016/0026-2714(91)90204-k. Acesso em: 23 jan. 2026.
    • APA

      Roda, V. O., & Trindade Junior, O. (1991). On the effect of power-line disturbances on microcomputer performance. Microeletronics and Reliability, 31( 2-3), 229-35. doi:10.1016/0026-2714(91)90204-k
    • NLM

      Roda VO, Trindade Junior O. On the effect of power-line disturbances on microcomputer performance [Internet]. Microeletronics and Reliability. 1991 ;31( 2-3): 229-35.[citado 2026 jan. 23 ] Available from: https://doi.org/10.1016/0026-2714(91)90204-k
    • Vancouver

      Roda VO, Trindade Junior O. On the effect of power-line disturbances on microcomputer performance [Internet]. Microeletronics and Reliability. 1991 ;31( 2-3): 229-35.[citado 2026 jan. 23 ] Available from: https://doi.org/10.1016/0026-2714(91)90204-k

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