Calculation of two-dimensional scattering patterns for oriented systems (2017)
Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY. Unidade: IF
Subjects: ESPALHAMENTO DE RAIOS X A BAIXOS ÂNGULOS, MÉTODO DE MONTE CARLO
ABNT
ALVES, Cassio e PEDERSEN, Jan Skov e OLIVEIRA, Cristiano Luis Pinto de. Calculation of two-dimensional scattering patterns for oriented systems. JOURNAL OF APPLIED CRYSTALLOGRAPHY, v. 50, n. ju 2017, p. 840-850, 2017Tradução . . Disponível em: http://onlinelibrary.wiley.com/doi/10.1107/S1600576717005179/abstract. Acesso em: 10 fev. 2026.APA
Alves, C., Pedersen, J. S., & Oliveira, C. L. P. de. (2017). Calculation of two-dimensional scattering patterns for oriented systems. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 50( ju 2017), 840-850. doi:10.1107/S1600576717005179NLM
Alves C, Pedersen JS, Oliveira CLP de. Calculation of two-dimensional scattering patterns for oriented systems [Internet]. JOURNAL OF APPLIED CRYSTALLOGRAPHY. 2017 ; 50( ju 2017): 840-850.[citado 2026 fev. 10 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S1600576717005179/abstractVancouver
Alves C, Pedersen JS, Oliveira CLP de. Calculation of two-dimensional scattering patterns for oriented systems [Internet]. JOURNAL OF APPLIED CRYSTALLOGRAPHY. 2017 ; 50( ju 2017): 840-850.[citado 2026 fev. 10 ] Available from: http://onlinelibrary.wiley.com/doi/10.1107/S1600576717005179/abstract
