Study of thick anodic oxide films on 'PT' by spectroscopic ellipsometry (1991)
Source: Extended Abstracts. Conference titles: Spring Meeting of the Eletrochemical Society. Unidade: IQSC
Assunto: ELETROQUÍMICA
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TICIANELLI, Edson Antonio et al. Study of thick anodic oxide films on 'PT' by spectroscopic ellipsometry. 1991, Anais.. Pennington: Electrochemical Society, 1991. . Acesso em: 04 out. 2024.APA
Ticianelli, E. A., Tremiliosi Filho, G., Maia, G., Floriano, J. B., & Gottesfeld, S. (1991). Study of thick anodic oxide films on 'PT' by spectroscopic ellipsometry. In Extended Abstracts. Pennington: Electrochemical Society.NLM
Ticianelli EA, Tremiliosi Filho G, Maia G, Floriano JB, Gottesfeld S. Study of thick anodic oxide films on 'PT' by spectroscopic ellipsometry. Extended Abstracts. 1991 ;[citado 2024 out. 04 ]Vancouver
Ticianelli EA, Tremiliosi Filho G, Maia G, Floriano JB, Gottesfeld S. Study of thick anodic oxide films on 'PT' by spectroscopic ellipsometry. Extended Abstracts. 1991 ;[citado 2024 out. 04 ]