Fonte: Proceedings. Nome do evento: Ec Pvse. Unidade: EP
Assuntos: FILMES FINOS, ELETRODEPOSIÇÃO
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ABNT
ANDRADE, Adnei Melges de. Electro-optical characterization of amorphous silicon films deposited in a two-consecutive decomposition and deposition chambers systems. 1985, Anais.. London: Escola Politécnica, Universidade de São Paulo, 1985. . Acesso em: 04 out. 2024.APA
Andrade, A. M. de. (1985). Electro-optical characterization of amorphous silicon films deposited in a two-consecutive decomposition and deposition chambers systems. In Proceedings. London: Escola Politécnica, Universidade de São Paulo.NLM
Andrade AM de. Electro-optical characterization of amorphous silicon films deposited in a two-consecutive decomposition and deposition chambers systems. Proceedings. 1985 ;[citado 2024 out. 04 ]Vancouver
Andrade AM de. Electro-optical characterization of amorphous silicon films deposited in a two-consecutive decomposition and deposition chambers systems. Proceedings. 1985 ;[citado 2024 out. 04 ]
