Source: Microscopy Research and Technique. Unidade: IF
Subjects: FÍSICA NUCLEAR, FILMES FINOS, ESPECTROSCOPIA DE RAIO X, CROMO, ALUMÍNIO, NÍQUEL, SILÍCIO, MICROANÁLISE
ABNT
OBLITAS, Raissa L.; TEIXEIRA, Fernanda S.; SALVADORI, M. C. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, New Jersey, p. 10 , 2021. Disponível em: < https://doi.org/10.1002/jemt.23917 > DOI: 10.1002/jemt.23917.APA
Oblitas, R. L., Teixeira, F. S., & Salvadori, M. C. (2021). Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis. Microscopy Research and Technique, 10 . doi:10.1002/jemt.23917NLM
Oblitas RL, Teixeira FS, Salvadori MC. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .Available from: https://doi.org/10.1002/jemt.23917Vancouver
Oblitas RL, Teixeira FS, Salvadori MC. Determination of the composition and thickness of chromel and alumel thin films on different substrates by quantitative energy dispersive spectroscopy analysis [Internet]. Microscopy Research and Technique. 2021 ;10 .Available from: https://doi.org/10.1002/jemt.23917