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Artigo de periodico
Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method (2021)
Paula Allegro ; Zagatto, Vinicius Antonio Bocaline; Rodrigues, Cleber ; Tabacniks, Manfredo ; Rizzutto, Marcia A. ; Added, Nemitala ; Aguiar, Vitor ; Toufen, Dennis Lozano; Macchione, Eduardo Luiz Augusto; Medina, Nilberto H. ; Ribas, Roberto Vicençotto; Oliveira, José Roberto Brandão de ; Escudeiro, Rafael; Alcantara, Juan ; Curado, Jessica Fleury; Scarduelli, Valdir Brunetti
Source: Journal of Analytical Atomic Spectrometry. Unidade: IF
Subjects: FÍSICA NUCLEAR, REAÇÕES NUCLEARES, ESPECTROMETRIA, ISÓTOPOS ESTÁVEIS, COBRE
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ABNT
PAULA ALLEGRO,; ZAGATTO, Vinicius Antonio Bocaline; RODRIGUES, Cleber; et al. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method. Journal of Analytical Atomic Spectrometry, Londres, v. 36, n. 1, p. 120-132, 2021. Disponível em: < https://doi.org/10.1039/D0JA00283F > DOI: 10.1039/D0JA00283F.
APA
Paula Allegro,, Zagatto, V. A. B., Rodrigues, C., Tabacniks, M., Rizzutto, M. A., Added, N., et al. (2021). Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method. Journal of Analytical Atomic Spectrometry, 36( 1), 120-132. doi:10.1039/D0JA00283F
NLM
Paula Allegro, Zagatto VAB, Rodrigues C, Tabacniks M, Rizzutto MA, Added N, Aguiar V, Toufen DL, Macchione ELA, Medina NH, Ribas RV, Oliveira JRB de, Escudeiro R, Alcantara J, Curado JF, Scarduelli VB. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method [Internet]. Journal of Analytical Atomic Spectrometry. 2021 ; 36( 1): 120-132.Available from: https://doi.org/10.1039/D0JA00283F
Vancouver
Paula Allegro, Zagatto VAB, Rodrigues C, Tabacniks M, Rizzutto MA, Added N, Aguiar V, Toufen DL, Macchione ELA, Medina NH, Ribas RV, Oliveira JRB de, Escudeiro R, Alcantara J, Curado JF, Scarduelli VB. Determination of stable isotope ratios using nuclear reaction analysis coupled with a particle–gamma coincidence method [Internet]. Journal of Analytical Atomic Spectrometry. 2021 ; 36( 1): 120-132.Available from: https://doi.org/10.1039/D0JA00283F
Artigo de periodico
Ionizing radiation hardness tests of GaN HEMTs for harsh environments (2021)
Vilas Bôas, Alexis C.; Melo, M.A.A. de; Santos, R. B. B.; Giacomini, R.; Medina, Nilberto H. ; Seixas, L. E.; Finco, S.; Palomo, F. R.; Romero-Maestre, A.; Guazzelli, Marcilei A.
Source: Microelectronics Reliability. Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE, ELETRÔNICA QUÂNTICA, NANOTECNOLOGIA
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VILAS BÔAS, Alexis C.; MELO, M.A.A. de; SANTOS, R. B. B.; et al. Ionizing radiation hardness tests of GaN HEMTs for harsh environments. Microelectronics Reliability, Amsterdam, v. 116, 2021. Disponível em: < https://doi.org/10.1016/j.microrel.2020.114000 > DOI: 10.1016/j.microrel.2020.114000.
APA
Vilas Bôas, A. C., Melo, M. A. A. de, Santos, R. B. B., Giacomini, R., Medina, N. H., Seixas, L. E., et al. (2021). Ionizing radiation hardness tests of GaN HEMTs for harsh environments. Microelectronics Reliability, 116. doi:10.1016/j.microrel.2020.114000
NLM
Vilas Bôas AC, Melo MAA de, Santos RBB, Giacomini R, Medina NH, Seixas LE, Finco S, Palomo FR, Romero-Maestre A, Guazzelli MA. Ionizing radiation hardness tests of GaN HEMTs for harsh environments [Internet]. Microelectronics Reliability. 2021 ; 116Available from: https://doi.org/10.1016/j.microrel.2020.114000
Vancouver
Vilas Bôas AC, Melo MAA de, Santos RBB, Giacomini R, Medina NH, Seixas LE, Finco S, Palomo FR, Romero-Maestre A, Guazzelli MA. Ionizing radiation hardness tests of GaN HEMTs for harsh environments [Internet]. Microelectronics Reliability. 2021 ; 116Available from: https://doi.org/10.1016/j.microrel.2020.114000
Artigo de periodico
The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay (2020)
Finocchiaro, Paolo ; Medina, Nilberto H. ; Oliveira, José Roberto Brandão de ; Zagatto, Vinicius A. B.
Source: Universe. Unidade: IF
Subjects: FÍSICA NUCLEAR, FÍSICA DE PARTÍCULAS, NEUTRINOS, COLISÕES DE ÍONS PESADOS RELATIVÍSTICOS, ESPECTROMETRIA
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FINOCCHIARO, Paolo; MEDINA, Nilberto H.; OLIVEIRA, José Roberto Brandão de; ZAGATTO, Vinicius A. B. The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay. Universe, Suiça, 2020. Disponível em: < https://doi.org/10.3390/universe6090129 > DOI: 10.3390/universe6090129.
APA
Finocchiaro, P., Medina, N. H., Oliveira, J. R. B. de, & Zagatto, V. A. B. (2020). The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay. Universe. doi:10.3390/universe6090129
NLM
Finocchiaro P, Medina NH, Oliveira JRB de, Zagatto VAB. The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay [Internet]. Universe. 2020 ;Available from: https://doi.org/10.3390/universe6090129
Vancouver
Finocchiaro P, Medina NH, Oliveira JRB de, Zagatto VAB. The NUMEN Heavy Ion Multidetector for a Complementary Approach to the Neutrinoless Double Beta Decay [Internet]. Universe. 2020 ;Available from: https://doi.org/10.3390/universe6090129
Artigo de periodico
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects (2020)
Oliveira, Ádria ; Tambara, Lucas A.; Benevenuti, Fabio; Benites, Luis A. C.; Added, Nemitala ; Aguiar, Vitor ; Medina, N. H.; Guazzelli, Marcilei Aparecida ; Kastensmidt, Fernanda
Source: IEEE Transactions on Nuclear Science. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS, DISPOSITIVOS ELETRÔNICOS, MATERIAIS
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ABNT
OLIVEIRA, Ádria; TAMBARA, Lucas A.; BENEVENUTI, Fabio; et al. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, New Jersey, v. 67, n. 7, p. 1503-1510, 2020. Disponível em: < https://doi.org/10.1109/TNS.2020.2995729 > DOI: 10.1109/TNS.2020.2995729.
APA
Oliveira, Á., Tambara, L. A., Benevenuti, F., Benites, L. A. C., Added, N., Aguiar, V., et al. (2020). Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects. IEEE Transactions on Nuclear Science, 67( 7), 1503-1510. doi:10.1109/TNS.2020.2995729
NLM
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.Available from: https://doi.org/10.1109/TNS.2020.2995729
Vancouver
Oliveira Á, Tambara LA, Benevenuti F, Benites LAC, Added N, Aguiar V, Medina NH, Guazzelli MA, Kastensmidt F. Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects [Internet]. IEEE Transactions on Nuclear Science. 2020 ; 67( 7): 1503-1510.Available from: https://doi.org/10.1109/TNS.2020.2995729
Artigo de periodico
Neutron radiation effects on an electronic system on module (2020)
Lo Presti, Domenico ; Medina, Nilberto H. ; Aguiar, Vitor; Oliveira, José Roberto Brandão de ; Added, Nemitala; Macchione, Eduardo Luiz Augusto
Source: Review of Scientific Instruments. Unidade: IF
Subjects: FÍSICA NUCLEAR, FÍSICA DE PARTÍCULAS, ACELERADOR DE PARTÍCULAS, NÊUTRONS, DISPOSITIVOS ELETRÔNICOS, REAÇÕES NUCLEARES, REATORES NUCLEARES DE FISSÃO, ISÓTOPOS
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LO PRESTI, Domenico; MEDINA, Nilberto H.; AGUIAR, Vitor; et al. Neutron radiation effects on an electronic system on module. Review of Scientific Instruments, Maryland, v. 91, n. 8, 2020. Disponível em: < https://doi.org/10.1063/5.0010968 > DOI: 10.1063/5.0010968.
APA
Lo Presti, D., Medina, N. H., Aguiar, V., Oliveira, J. R. B. de, Added, N., & Macchione, E. L. A. (2020). Neutron radiation effects on an electronic system on module. Review of Scientific Instruments, 91( 8). doi:10.1063/5.0010968
NLM
Lo Presti D, Medina NH, Aguiar V, Oliveira JRB de, Added N, Macchione ELA. Neutron radiation effects on an electronic system on module [Internet]. Review of Scientific Instruments. 2020 ; 91( 8):Available from: https://doi.org/10.1063/5.0010968
Vancouver
Lo Presti D, Medina NH, Aguiar V, Oliveira JRB de, Added N, Macchione ELA. Neutron radiation effects on an electronic system on module [Internet]. Review of Scientific Instruments. 2020 ; 91( 8):Available from: https://doi.org/10.1063/5.0010968
Artigo de periodico
Analysis of two-nucleon transfer reactions in the 20Ne+116Cd system at 306 MeV (2020)
Carbone, D; Borello-Lewin, Thereza ; Medina, Nilberto Heder ; Oliveira, José Roberto Brandão de
Source: Physical Review C. Unidade: IF
Assunto: ÍONS PESADOS
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CARBONE, D; BORELLO-LEWIN, Thereza; MEDINA, Nilberto Heder; OLIVEIRA, José Roberto Brandão de. Analysis of two-nucleon transfer reactions in the 20Ne+116Cd system at 306 MeV. Physical Review C, College Park, Maryland, v. 102, 2020. DOI: 10.1103/PhysRevC.102.044606.
APA
Carbone, D., Borello-Lewin, T., Medina, N. H., & Oliveira, J. R. B. de. (2020). Analysis of two-nucleon transfer reactions in the 20Ne+116Cd system at 306 MeV. Physical Review C, 102. doi:10.1103/PhysRevC.102.044606
NLM
Carbone D, Borello-Lewin T, Medina NH, Oliveira JRB de. Analysis of two-nucleon transfer reactions in the 20Ne+116Cd system at 306 MeV. Physical Review C. 2020 ;102
Vancouver
Carbone D, Borello-Lewin T, Medina NH, Oliveira JRB de. Analysis of two-nucleon transfer reactions in the 20Ne+116Cd system at 306 MeV. Physical Review C. 2020 ;102
Trabalho de evento-anais periodico
Recent results on heavy-ion direct reactions of interest for 0νββ decayat INFN -LNS (2020)
Cavallaro, M; Borello-Lewin, Thereza ; Medina, Nilberto Heder ; Oliveira, José Roberto Brandão de
Source: Journal of Physics: Conference Series. Conference titles: Symposium on Nuclear Physics 2020 January 2020. Unidade: IF
Assunto: ÍONS PESADOS
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ABNT
CAVALLARO, M; BORELLO-LEWIN, Thereza; MEDINA, Nilberto Heder; OLIVEIRA, José Roberto Brandão de. Recent results on heavy-ion direct reactions of interest for 0νββ decayat INFN -LNS. Journal of Physics: Conference Series[S.l: s.n.], 2020. DOI: 10.1088/1742-6596/1610/1/012004.
APA
Cavallaro, M., Borello-Lewin, T., Medina, N. H., & Oliveira, J. R. B. de. (2020). Recent results on heavy-ion direct reactions of interest for 0νββ decayat INFN -LNS. Journal of Physics: Conference Series. Bristol: IOP Publishing. doi:10.1088/1742-6596/1610/1/012004
NLM
Cavallaro M, Borello-Lewin T, Medina NH, Oliveira JRB de. Recent results on heavy-ion direct reactions of interest for 0νββ decayat INFN -LNS. Journal of Physics: Conference Series. 2020 ; 1610
Vancouver
Cavallaro M, Borello-Lewin T, Medina NH, Oliveira JRB de. Recent results on heavy-ion direct reactions of interest for 0νββ decayat INFN -LNS. Journal of Physics: Conference Series. 2020 ; 1610
Artigo de periodico
Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy (2020)
González, Carlos J; Added, Nemitala ; Macchione, Eduardo L A; Aguiar, Vitor Ângelo Paulino de ; Kastensmidt, Fernanda G L; Puchner, Helmut K; Guazzelli, Marcilei A ; Medina, Nilberto Heder ; Balen, Tiago R
Source: IEEE Transactions on Nuclear Science. Unidade: IF
Assunto: ÍONS PESADOS
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GONZÁLEZ, Carlos J; ADDED, Nemitala; MACCHIONE, Eduardo L A; et al. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, Piscataway, NJ, v. . 67, n. 3, p. 518-524, 2020. DOI: 10.1109/TNS.2019.2952775.
APA
González, C. J., Added, N., Macchione, E. L. A., Aguiar, V. Â. P. de, Kastensmidt, F. G. L., Puchner, H. K., et al. (2020). Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science, . 67( 3), 518-524. doi:10.1109/TNS.2019.2952775
NLM
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.
Vancouver
González CJ, Added N, Macchione ELA, Aguiar VÂP de, Kastensmidt FGL, Puchner HK, Guazzelli MA, Medina NH, Balen TR. Reducing Soft Error Rate of SoCs Analog-to-Digital Interfaces With Design Diversity Redundancy. IEEE Transactions on Nuclear Science. 2020 ;. 67( 3): 518-524.
Artigo de periodico
First comparison of GEANT4 hadrontherapy physics model withexperimental data for a NUMEN project reaction case (2020)
Oliveira, José Roberto Brandão de ; Lewin, Thereza Borello ; Medina, Nilberto Heder
Source: European Physical Journal A. Unidade: IF
Subjects: RAIOS GAMA, NÊUTRONS
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OLIVEIRA, José Roberto Brandão de; LEWIN, Thereza Borello; MEDINA, Nilberto Heder. First comparison of GEANT4 hadrontherapy physics model withexperimental data for a NUMEN project reaction case. European Physical Journal A, Berlin, v. 56, 2020. DOI: 10.1140/epja/s10050-020-00152-6.
APA
Oliveira, J. R. B. de, Lewin, T. B., & Medina, N. H. (2020). First comparison of GEANT4 hadrontherapy physics model withexperimental data for a NUMEN project reaction case. European Physical Journal A, 56. doi:10.1140/epja/s10050-020-00152-6
NLM
Oliveira JRB de, Lewin TB, Medina NH. First comparison of GEANT4 hadrontherapy physics model withexperimental data for a NUMEN project reaction case. European Physical Journal A. 2020 ; 56
Vancouver
Oliveira JRB de, Lewin TB, Medina NH. First comparison of GEANT4 hadrontherapy physics model withexperimental data for a NUMEN project reaction case. European Physical Journal A. 2020 ; 56
Trabalho de evento
Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor (2020)
Bôas, Alexis Cristiano Vilas; Melo, M A A de; Santos, R B B; Giacomini, R C; Medina, Nilberto Heder ; Seixas, L E; Palomo, F R; Guazzelli, Marcilei Aparecida
Conference titles: Symposium on Microelectronics Technology and Devices (SBMicro). Unidade: IF
Assunto: RADIAÇÃO IONIZANTE
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BÔAS, Alexis Cristiano Vilas; MELO, M A A de; SANTOS, R B B; et al. Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor. Anais.. Piscataway, Nova Jersey, USA: Institute of Electrical and Electronics Engineers, 2020. DOI: 10.1109/SBMicro.2019.8919340.
APA
Bôas, A. C. V., Melo, M. A. A. de, Santos, R. B. B., Giacomini, R. C., Medina, N. H., Seixas, L. E., et al. (2020). Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor. In . Piscataway, Nova Jersey, USA: Institute of Electrical and Electronics Engineers. doi:10.1109/SBMicro.2019.8919340
NLM
Bôas ACV, Melo MAA de, Santos RBB, Giacomini RC, Medina NH, Seixas LE, Palomo FR, Guazzelli MA. Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor. 2020 ;
Vancouver
Bôas ACV, Melo MAA de, Santos RBB, Giacomini RC, Medina NH, Seixas LE, Palomo FR, Guazzelli MA. Assessment of Ionizing Radiation Hardness of a GaN Field-Effect Transistor. 2020 ;
Artigo de periodico
SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil (2020)
Aguiar, Vitor ; Medina, Nilberto Heder ; Added, Nemitala ; Macchione, E. L. A.; Alberton, S. G.; Leite, A. R. ; Aguirre, F. R.; Ribas, R. V.; Perego, C. C.; Fagundes, L. M.; Terassi, J. C.; Brage, J. A. P.; Simões, R. F.; Morais, O. B.; Almeida, E. A.; Joaquim, P. M.; Souza, M. S.; Cecotte, A. F. M.; Martins, R.; Duarte, J. G. ; Scarduelli, V. B.; Allegro, P. R. P.; Escudeiro, R.; Leistenschneider, E.; Oliveira, R. A. N.; Servelo, W. A.; Silva, M. T.; Sarmento, V. E.; Carreira, C. A.; Abreu, J. C.; Silva, S. C.; Santos, H. C.; Rodrigues, C. L.; Assis, R. F.; Silva, T. F. ; Tabacniks, Manfredo Harri ; Joaquim, A. S.; Minas, J. H. P.; Kashinskiy, D.; Guazzelli, M. A. ; Benevenutti, F. ; Seixas Jr., L. E. ; Finco, S.
Source: AIP Review of Scientific Instruments. Unidade: IF
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS, DISPOSITIVOS ÓPTICOS, SEMICONDUTORES (FÍSICO-QUÍMICA), ACELERADOR DE PARTÍCULAS, DISPOSITIVOS ELETRÔNICOS
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ABNT
AGUIAR, Vitor; MEDINA, Nilberto Heder; ADDED, Nemitala; et al. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil. AIP Review of Scientific Instruments, New York, v. 91, n. 5, 2020. Disponível em: < https://doi.org/10.1063/1.5138644 > DOI: 10.1063/1.5138644.
APA
Aguiar, V., Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G., Leite, A. R., et al. (2020). SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil. AIP Review of Scientific Instruments, 91( 5). doi:10.1063/1.5138644
NLM
Aguiar V, Medina NH, Added N, Macchione ELA, Alberton SG, Leite AR, Aguirre FR, Ribas RV, Perego CC, Fagundes LM, Terassi JC, Brage JAP, Simões RF, Morais OB, Almeida EA, Joaquim PM, Souza MS, Cecotte AFM, Martins R, Duarte JG, Scarduelli VB, Allegro PRP, Escudeiro R, Leistenschneider E, Oliveira RAN, Servelo WA, Silva MT, Sarmento VE, Carreira CA, Abreu JC, Silva SC, Santos HC, Rodrigues CL, Assis RF, Silva TF, Tabacniks MH, Joaquim AS, Minas JHP, Kashinskiy D, Guazzelli MA, Benevenutti F, Seixas Jr. LE, Finco S. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil [Internet]. AIP Review of Scientific Instruments. 2020 ; 91( 5):Available from: https://doi.org/10.1063/1.5138644
Vancouver
Aguiar V, Medina NH, Added N, Macchione ELA, Alberton SG, Leite AR, Aguirre FR, Ribas RV, Perego CC, Fagundes LM, Terassi JC, Brage JAP, Simões RF, Morais OB, Almeida EA, Joaquim PM, Souza MS, Cecotte AFM, Martins R, Duarte JG, Scarduelli VB, Allegro PRP, Escudeiro R, Leistenschneider E, Oliveira RAN, Servelo WA, Silva MT, Sarmento VE, Carreira CA, Abreu JC, Silva SC, Santos HC, Rodrigues CL, Assis RF, Silva TF, Tabacniks MH, Joaquim AS, Minas JHP, Kashinskiy D, Guazzelli MA, Benevenutti F, Seixas Jr. LE, Finco S. SAFIIRA: A heavy-ion multi-purpose irradiation facility in Brazil [Internet]. AIP Review of Scientific Instruments. 2020 ; 91( 5):Available from: https://doi.org/10.1063/1.5138644
Artigo de periodico
Analysis of the background on cross section measurements with the MAGNEX spectrometer: The (20Ne, 20O) Double Charge Exchange case (2020)
Calabrese, S; Borello-Lewin, Thereza ; Medina, Nilberto Heder ; Oliveira, José Roberto Brandão de
Source: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Unidade: IF
Subjects: ESPECTROMETRIA, ÍONS PESADOS
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ABNT
CALABRESE, S; BORELLO-LEWIN, Thereza; MEDINA, Nilberto Heder; OLIVEIRA, José Roberto Brandão de. Analysis of the background on cross section measurements with the MAGNEX spectrometer: The (20Ne, 20O) Double Charge Exchange case. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Amsterdan, v. 980, 2020. DOI: 10.1016/j.nima.2020.164500.
APA
Calabrese, S., Borello-Lewin, T., Medina, N. H., & Oliveira, J. R. B. de. (2020). Analysis of the background on cross section measurements with the MAGNEX spectrometer: The (20Ne, 20O) Double Charge Exchange case. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 980. doi:10.1016/j.nima.2020.164500
NLM
Calabrese S, Borello-Lewin T, Medina NH, Oliveira JRB de. Analysis of the background on cross section measurements with the MAGNEX spectrometer: The (20Ne, 20O) Double Charge Exchange case. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2020 ; 980
Vancouver
Calabrese S, Borello-Lewin T, Medina NH, Oliveira JRB de. Analysis of the background on cross section measurements with the MAGNEX spectrometer: The (20Ne, 20O) Double Charge Exchange case. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2020 ; 980
Trabalho de evento
Elemental composition in brazilian fish (2019)
Nascimento, Natália Bravin; Guazzelli, Marcilei A ; Curado, Jessica Fleury; Medina, Nilberto Heder
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: FLUORESCÊNCIA
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NASCIMENTO, Natália Bravin; GUAZZELLI, Marcilei A; CURADO, Jessica Fleury; MEDINA, Nilberto Heder. Elemental composition in brazilian fish. Anais.. São Paulo: Sociedade Brasileira de Física, 2019.
APA
Nascimento, N. B., Guazzelli, M. A., Curado, J. F., & Medina, N. H. (2019). Elemental composition in brazilian fish. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Nascimento NB, Guazzelli MA, Curado JF, Medina NH. Elemental composition in brazilian fish. Abstracts. 2019 ;
Vancouver
Nascimento NB, Guazzelli MA, Curado JF, Medina NH. Elemental composition in brazilian fish. Abstracts. 2019 ;
Trabalho de evento-resumo
Lifetime measurements in excited states of nuclei in the A = 70 mass region (2019)
Escudeiro, Rafael; Medina, Nilberto Heder; Added, Nemitala; Macchione, Eduardo Luiz Augusto; Ribas, Roberto Vicençotto; Allegro, Paula Rangel Pestana; Oliveira, José Roberto Brandão de; Aguiar, Vitor Ângelo Paulino de; Alberton, Saulo Gabriel Pereira Nascimento; Alcantara-Nunez, Juan Antonio; Scarduelli, Valdir Brunetti; Kurman. Valter Luiz
Source: Abstracts. Conference titles: Escola de Verão Jorge André Swieca Física Nuclear Teórica. Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE
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ABNT
ESCUDEIRO, Rafael; MEDINA, Nilberto Heder; ADDED, Nemitala; et al. Lifetime measurements in excited states of nuclei in the A = 70 mass region. Anais.. São Paulo: SBF, 2019.
APA
Escudeiro, R., Medina, N. H., Added, N., Macchione, E. L. A., Ribas, R. V., Allegro, P. R. P., et al. (2019). Lifetime measurements in excited states of nuclei in the A = 70 mass region. In Abstracts. São Paulo: SBF.
NLM
Escudeiro R, Medina NH, Added N, Macchione ELA, Ribas RV, Allegro PRP, Oliveira JRB de, Aguiar VÂP de, Alberton SGPN, Alcantara-Nunez JA, Scarduelli VB, Kurman. Valter Luiz. Lifetime measurements in excited states of nuclei in the A = 70 mass region. Abstracts. 2019 ;
Vancouver
Escudeiro R, Medina NH, Added N, Macchione ELA, Ribas RV, Allegro PRP, Oliveira JRB de, Aguiar VÂP de, Alberton SGPN, Alcantara-Nunez JA, Scarduelli VB, Kurman. Valter Luiz. Lifetime measurements in excited states of nuclei in the A = 70 mass region. Abstracts. 2019 ;
Trabalho de evento-resumo
Destructive single-event effects in semiconductor devices (2019)
Alberton, Saulo Gabriel Pereira Nascimento; Medina, Nilberto Heder; Added, Nemitala; Menegasso, Ricardo; Macchione, Eduardo Luiz Augusto; Aguiar, Vitor Ângelo Paulino de; Ribas, Roberto Vicençotto
Source: Abstracts. Conference titles: Escola de Verão Jorge André Swieca Física Nuclear Teórica. Unidade: IF
Subjects: FÍSICA NUCLEAR, RADIAÇÃO IONIZANTE
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento; MEDINA, Nilberto Heder; ADDED, Nemitala; et al. Destructive single-event effects in semiconductor devices. Anais.. São Paulo: SBF, 2019.
APA
Alberton, S. G. P. N., Medina, N. H., Added, N., Menegasso, R., Macchione, E. L. A., Aguiar, V. Â. P. de, & Ribas, R. V. (2019). Destructive single-event effects in semiconductor devices. In Abstracts. São Paulo: SBF.
NLM
Alberton SGPN, Medina NH, Added N, Menegasso R, Macchione ELA, Aguiar VÂP de, Ribas RV. Destructive single-event effects in semiconductor devices. Abstracts. 2019 ;
Vancouver
Alberton SGPN, Medina NH, Added N, Menegasso R, Macchione ELA, Aguiar VÂP de, Ribas RV. Destructive single-event effects in semiconductor devices. Abstracts. 2019 ;
Artigo de periodico
Charge-state distributions of 20Ne ions emerging from thin foils (2019)
Cavallaro, Manuela; Borello-Lewin, Thereza ; Medina, Nilberto Heder ; Oliveira, José Roberto Brandão de
Source: Results in Physics. Unidade: IF
Subjects: ESPECTROSCOPIA, FÍSICA NUCLEAR, ISÓTOPOS, FISSÃO NUCLEAR
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CAVALLARO, Manuela; BORELLO-LEWIN, Thereza; MEDINA, Nilberto Heder; OLIVEIRA, José Roberto Brandão de. Charge-state distributions of 20Ne ions emerging from thin foils. Results in Physics, Amsterdam, v. 13, 2019. Disponível em: < https://doi.org/10.1016/j.rinp.2019.102191 > DOI: 10.1016/j.rinp.2019.102191.
APA
Cavallaro, M., Borello-Lewin, T., Medina, N. H., & Oliveira, J. R. B. de. (2019). Charge-state distributions of 20Ne ions emerging from thin foils. Results in Physics, 13. doi:10.1016/j.rinp.2019.102191
NLM
Cavallaro M, Borello-Lewin T, Medina NH, Oliveira JRB de. Charge-state distributions of 20Ne ions emerging from thin foils [Internet]. Results in Physics. 2019 ; 13Available from: https://doi.org/10.1016/j.rinp.2019.102191
Vancouver
Cavallaro M, Borello-Lewin T, Medina NH, Oliveira JRB de. Charge-state distributions of 20Ne ions emerging from thin foils [Internet]. Results in Physics. 2019 ; 13Available from: https://doi.org/10.1016/j.rinp.2019.102191
Trabalho de evento-resumo
Nuclear structure of nuclei in the A = 70 mass region (2019)
Escudeiro, Rafael; Medina, Nilberto Heder ; Allegro, Paula Rangel Pestana; Oliveira, José Roberto Brandão de; Ribas, Roberto Vicençotto; Aguiar, Vitor Ângelo Paulino de; Alberton, Saulo Gabriel Pereira Nascimento; Alcantara-Nunez, Juan Antonio; Added, Nemitala; Macchione, Eduardo Luiz Augusto; Scarduelli, Valdir Brunetti; Kurman. Valter Luiz
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: ESTRUTURA NUCLEAR
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ESCUDEIRO, Rafael; MEDINA, Nilberto Heder; ALLEGRO, Paula Rangel Pestana; et al. Nuclear structure of nuclei in the A = 70 mass region. Anais.. São Paulo: Sociedade Brasileira de Física, 2019.
APA
Escudeiro, R., Medina, N. H., Allegro, P. R. P., Oliveira, J. R. B. de, Ribas, R. V., Aguiar, V. Â. P. de, et al. (2019). Nuclear structure of nuclei in the A = 70 mass region. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Escudeiro R, Medina NH, Allegro PRP, Oliveira JRB de, Ribas RV, Aguiar VÂP de, Alberton SGPN, Alcantara-Nunez JA, Added N, Macchione ELA, Scarduelli VB, Kurman. Valter Luiz. Nuclear structure of nuclei in the A = 70 mass region. Abstracts. 2019 ;
Vancouver
Escudeiro R, Medina NH, Allegro PRP, Oliveira JRB de, Ribas RV, Aguiar VÂP de, Alberton SGPN, Alcantara-Nunez JA, Added N, Macchione ELA, Scarduelli VB, Kurman. Valter Luiz. Nuclear structure of nuclei in the A = 70 mass region. Abstracts. 2019 ;
Trabalho de evento-resumo
Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices (2019)
Aguiar, Vitor Ângelo Paulino de; Medina, Nilberto Heder ; Added, Nemitala; Macchione, Eduardo Luiz Augusto; Alberton, Saulo Gabriel Pereira Nascimento; Scarduelli, Valdir Brunetti; Allegro, Paula Rangel Pestana; Escudeiro, Rafael; Santos, Hellen Cristine dos ; Silva, Tiago Fiorini da ; Rodrigues, Cleber Lima ; Leite, Alisson Rodolfo; Santos, Osvaldo Camargo Botelho dos
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: RADIAÇÃO IONIZANTE
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
AGUIAR, Vitor Ângelo Paulino de; MEDINA, Nilberto Heder; ADDED, Nemitala; et al. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Anais.. São Paulo: Sociedade Brasileira de Física, 2019.
APA
Aguiar, V. Â. P. de, Medina, N. H., Added, N., Macchione, E. L. A., Alberton, S. G. P. N., Scarduelli, V. B., et al. (2019). Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;
Vancouver
Aguiar VÂP de, Medina NH, Added N, Macchione ELA, Alberton SGPN, Scarduelli VB, Allegro PRP, Escudeiro R, Santos HC dos, Silva TF da, Rodrigues CL, Leite AR, Santos OCB dos. Structural aspects of ion-induced charge collection and single-event cross-section on electronic devices. Abstracts. 2019 ;
Trabalho de evento-resumo
Critical dependencies of heavy ion-induced destructive failures in electronic devices (2019)
Alberton, Saulo Gabriel Pereira Nascimento; Medina, Nilberto Heder ; Added, Nemitala; Aguiar, v a p; Menegasso, Ricardo; Macchione, Eduardo Luiz Augusto; Escudeiro, Rafael; Guazzelli, M A; Flechas, D
Source: Abstracts. Conference titles: Reunião de Trabalho sobre Física Nuclear no Brasil. Unidade: IF
Assunto: ÍONS PESADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
ALBERTON, Saulo Gabriel Pereira Nascimento; MEDINA, Nilberto Heder; ADDED, Nemitala; et al. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Anais.. São Paulo: Sociedade Brasileira de Física, 2019.
APA
Alberton, S. G. P. N., Medina, N. H., Added, N., Aguiar, v a p, Menegasso, R., Macchione, E. L. A., et al. (2019). Critical dependencies of heavy ion-induced destructive failures in electronic devices. In Abstracts. São Paulo: Sociedade Brasileira de Física.
NLM
Alberton SGPN, Medina NH, Added N, Aguiar v a p, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;
Vancouver
Alberton SGPN, Medina NH, Added N, Aguiar v a p, Menegasso R, Macchione ELA, Escudeiro R, Guazzelli MA, Flechas D. Critical dependencies of heavy ion-induced destructive failures in electronic devices. Abstracts. 2019 ;
Artigo de periodico
Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA (2019)
Benites, Luis A. C.; Benevenuti, Fabio ; Oliveira, Adria B de ; Kastensmidt, Fernanda L ; Added, Nemitala ; Aguiar, Vitor Ângelo Paulino de ; Nilberto H. Medina, Nilberto Heder ; Guazzelli, Marcilei A
Source: IEEE Transactions on Nuclear Science. Unidades: IF, IB
Subjects: FÍSICA NUCLEAR, ÍONS PESADOS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
BENITES, Luis A. C.; BENEVENUTI, Fabio; OLIVEIRA, Adria B de; et al. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, Piscataway, NJ, v. 66 , n. 7, p. 1433-1440, 2019. Disponível em: < https://ieeexplore.ieee.org/document/8733842 > DOI: 10.1109/TNS.2019.2921796.
APA
Benites, L. A. C., Benevenuti, F., Oliveira, A. B. de, Kastensmidt, F. L., Added, N., Aguiar, V. Â. P. de, et al. (2019). Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA. IEEE Transactions on Nuclear Science, 66 ( 7), 1433-1440. doi:10.1109/TNS.2019.2921796
NLM
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.Available from: https://ieeexplore.ieee.org/document/8733842
Vancouver
Benites LAC, Benevenuti F, Oliveira AB de, Kastensmidt FL, Added N, Aguiar VÂP de, Nilberto H. Medina NH, Guazzelli MA. Reliability Calculation With Respect to Functional Failures Induced by Radiation in TMR Arm Cortex-M0 Soft-Core Embedded Into SRAM-Based FPGA [Internet]. IEEE Transactions on Nuclear Science. 2019 ; 66 ( 7): 1433-1440.Available from: https://ieeexplore.ieee.org/document/8733842

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