Filters : "Odo, G Y" Limpar


  • In: Journal of Applied Crystallography. Unidades: IF, EP

    Subjects: Cristalografia Física, Filmes Finos, Semicondutores (físico-química)

    Online source accessDOIHow to cite
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    • ABNT

      PRADO, R J; ODO, G Y; LEPIENSKI, C M; FANTINI, Márcia Carvalho de Abreu; PEREYRA, Inés. Structural and morphological investigation of amorphous hydrogenated silicon carbide. Journal of Applied Crystallography, Copenhagen, v. 34, p. 465-472, 2001. Disponível em: < http://journals.iucr.org/j/issues/2001/04/00/issconts.html > DOI: 10.1107/s0021889801007889.
    • APA

      Prado, R. J., Odo, G. Y., Lepienski, C. M., Fantini, M. C. de A., & Pereyra, I. (2001). Structural and morphological investigation of amorphous hydrogenated silicon carbide. Journal of Applied Crystallography, 34, 465-472. doi:10.1107/s0021889801007889
    • NLM

      Prado RJ, Odo GY, Lepienski CM, Fantini MC de A, Pereyra I. Structural and morphological investigation of amorphous hydrogenated silicon carbide [Internet]. Journal of Applied Crystallography. 2001 ; 34 465-472.Available from: http://journals.iucr.org/j/issues/2001/04/00/issconts.html
    • Vancouver

      Prado RJ, Odo GY, Lepienski CM, Fantini MC de A, Pereyra I. Structural and morphological investigation of amorphous hydrogenated silicon carbide [Internet]. Journal of Applied Crystallography. 2001 ; 34 465-472.Available from: http://journals.iucr.org/j/issues/2001/04/00/issconts.html


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