Source: Langmuir. Unidade: IQSC
Assunto: QUITOSANA
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TAKETA, Thiago Bezerra et al. Investigation of the internal chemical composition of chitosan based LbL films by depht-profiling X-ray photoelectron spectroscopy (XPS) analysis. Langmuir, v. 34, p. 1429-1440, 2018Tradução . . Disponível em: https://doi.org/10.1021/acs.langmuir.7b04104. Acesso em: 18 ago. 2024.APA
Taketa, T. B., Santos, D. M. dos, Flamingo, A., Vaz, J. M., Beppu, M. M., Campana Filho, S. P., et al. (2018). Investigation of the internal chemical composition of chitosan based LbL films by depht-profiling X-ray photoelectron spectroscopy (XPS) analysis. Langmuir, 34, 1429-1440. doi:10.1021/acs.langmuir.7b04104NLM
Taketa TB, Santos DM dos, Flamingo A, Vaz JM, Beppu MM, Campana Filho SP, Cohen RE, Rubner MF. Investigation of the internal chemical composition of chitosan based LbL films by depht-profiling X-ray photoelectron spectroscopy (XPS) analysis [Internet]. Langmuir. 2018 ; 34 1429-1440.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1021/acs.langmuir.7b04104Vancouver
Taketa TB, Santos DM dos, Flamingo A, Vaz JM, Beppu MM, Campana Filho SP, Cohen RE, Rubner MF. Investigation of the internal chemical composition of chitosan based LbL films by depht-profiling X-ray photoelectron spectroscopy (XPS) analysis [Internet]. Langmuir. 2018 ; 34 1429-1440.[citado 2024 ago. 18 ] Available from: https://doi.org/10.1021/acs.langmuir.7b04104