Subjects: USINAGEM, FERRAMENTAS, ENGENHARIA MECÂNICA
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JASINEVICIUS, Renato Goulart et al. Surface quality evaluation of diamond turned semiconductor crystal by means of atomic force microscopy. 2001, Anais.. Curitiba: ABCM, 2001. . Acesso em: 30 set. 2024.APA
Jasinevicius, R. G., Silva, H. A. T. da, Montanari, L., Tsukamoto, R., & Duduch, J. G. (2001). Surface quality evaluation of diamond turned semiconductor crystal by means of atomic force microscopy. In . Curitiba: ABCM.NLM
Jasinevicius RG, Silva HAT da, Montanari L, Tsukamoto R, Duduch JG. Surface quality evaluation of diamond turned semiconductor crystal by means of atomic force microscopy. 2001 ;[citado 2024 set. 30 ]Vancouver
Jasinevicius RG, Silva HAT da, Montanari L, Tsukamoto R, Duduch JG. Surface quality evaluation of diamond turned semiconductor crystal by means of atomic force microscopy. 2001 ;[citado 2024 set. 30 ]