Characterization of niobium-doped lead titanate thin films (1996)
Source: Japanese Journal of Applied Physics. Unidade: EP
Assunto: ENGENHARIA MECÂNICA
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IBRAHIM, Ricardo Cury et al. Characterization of niobium-doped lead titanate thin films. Japanese Journal of Applied Physics, v. 35, n. 9B, p. 4995-4998, 1996Tradução . . Disponível em: https://doi.org/10.1143/JJAP.35.4995. Acesso em: 17 nov. 2024.APA
Ibrahim, R. C., Sakai, T., Nishida, T., Horiuchi, T., Shiosaki, T., & Matsushige, K. (1996). Characterization of niobium-doped lead titanate thin films. Japanese Journal of Applied Physics, 35( 9B), 4995-4998. doi:10.1143/JJAP.35.4995NLM
Ibrahim RC, Sakai T, Nishida T, Horiuchi T, Shiosaki T, Matsushige K. Characterization of niobium-doped lead titanate thin films [Internet]. Japanese Journal of Applied Physics. 1996 ; 35( 9B): 4995-4998.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1143/JJAP.35.4995Vancouver
Ibrahim RC, Sakai T, Nishida T, Horiuchi T, Shiosaki T, Matsushige K. Characterization of niobium-doped lead titanate thin films [Internet]. Japanese Journal of Applied Physics. 1996 ; 35( 9B): 4995-4998.[citado 2024 nov. 17 ] Available from: https://doi.org/10.1143/JJAP.35.4995