Source: Nuclear Instruments and Methods in Physics Research B. Unidade: IF
Assunto: FÍSICA NUCLEAR
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
CESAREO, Roberto et al. Metal location and thickness in a multilayered sheet by measuring K`alpha´/K`beta´, L`alpha´/L`beta´and L`alpha´/L`gama´ X-ray ratios. Nuclear Instruments and Methods in Physics Research B, v. 267, n. 17, p. 2890-2896, 2009Tradução . . Disponível em: http://www.sciencedirect.com/science/journal/0168583X. Acesso em: 01 ago. 2024.APA
Cesareo, R., Rizzutto, M. de A., Brrunetti, A., & Rao, D. V. (2009). Metal location and thickness in a multilayered sheet by measuring K`alpha´/K`beta´, L`alpha´/L`beta´and L`alpha´/L`gama´ X-ray ratios. Nuclear Instruments and Methods in Physics Research B, 267( 17), 2890-2896. Recuperado de http://www.sciencedirect.com/science/journal/0168583XNLM
Cesareo R, Rizzutto M de A, Brrunetti A, Rao DV. Metal location and thickness in a multilayered sheet by measuring K`alpha´/K`beta´, L`alpha´/L`beta´and L`alpha´/L`gama´ X-ray ratios [Internet]. Nuclear Instruments and Methods in Physics Research B. 2009 ; 267( 17): 2890-2896.[citado 2024 ago. 01 ] Available from: http://www.sciencedirect.com/science/journal/0168583XVancouver
Cesareo R, Rizzutto M de A, Brrunetti A, Rao DV. Metal location and thickness in a multilayered sheet by measuring K`alpha´/K`beta´, L`alpha´/L`beta´and L`alpha´/L`gama´ X-ray ratios [Internet]. Nuclear Instruments and Methods in Physics Research B. 2009 ; 267( 17): 2890-2896.[citado 2024 ago. 01 ] Available from: http://www.sciencedirect.com/science/journal/0168583X
