Source: Journal of Dental Research. Conference titles: Annual Meeting. Unidade: FO
Subjects: MICROSCOPIA ELETRÔNICA, ESMALTE DENTÁRIO
ABNT
NAUFF, F. e NACCARATO, S. R. F. e TORTAMANO, André. A scanning electron microscopic evaluation of the enamel surface subsequent to various debonding procedures. Journal of Dental Research. Alexandria: Faculdade de Odontologia, Universidade de São Paulo. . Acesso em: 28 abr. 2026. , 2003APA
Nauff, F., Naccarato, S. R. F., & Tortamano, A. (2003). A scanning electron microscopic evaluation of the enamel surface subsequent to various debonding procedures. Journal of Dental Research. Alexandria: Faculdade de Odontologia, Universidade de São Paulo.NLM
Nauff F, Naccarato SRF, Tortamano A. A scanning electron microscopic evaluation of the enamel surface subsequent to various debonding procedures. Journal of Dental Research. 2003 ;82 C-138.[citado 2026 abr. 28 ]Vancouver
Nauff F, Naccarato SRF, Tortamano A. A scanning electron microscopic evaluation of the enamel surface subsequent to various debonding procedures. Journal of Dental Research. 2003 ;82 C-138.[citado 2026 abr. 28 ]
