An Integrated-Approach for Designing and Testing Specific Processors (2013)
Source: International Journal of VLSI Design & Communication Systems. Unidade: EP
Assunto: CONTROLADORES DIGITAIS
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PENTEADO, Cesar Giacomini e KOFUJI, Sergio Takeo e MORENO, Edward David. An Integrated-Approach for Designing and Testing Specific Processors. International Journal of VLSI Design & Communication Systems, v. 4, n. 5, p. 1-17, 2013Tradução . . Disponível em: https://doi.org/10.5121/vlsic.2013.4501. Acesso em: 10 out. 2024.APA
Penteado, C. G., Kofuji, S. T., & Moreno, E. D. (2013). An Integrated-Approach for Designing and Testing Specific Processors. International Journal of VLSI Design & Communication Systems, 4( 5), 1-17. doi:10.5121/vlsic.2013.4501NLM
Penteado CG, Kofuji ST, Moreno ED. An Integrated-Approach for Designing and Testing Specific Processors [Internet]. International Journal of VLSI Design & Communication Systems. 2013 ; 4( 5): 1-17.[citado 2024 out. 10 ] Available from: https://doi.org/10.5121/vlsic.2013.4501Vancouver
Penteado CG, Kofuji ST, Moreno ED. An Integrated-Approach for Designing and Testing Specific Processors [Internet]. International Journal of VLSI Design & Communication Systems. 2013 ; 4( 5): 1-17.[citado 2024 out. 10 ] Available from: https://doi.org/10.5121/vlsic.2013.4501