Filtros : "Martínez, José Mário" "Mulato, Marcelo" Removido: "2008" Limpar

Filtros



Refine with date range


  • Source: Applied Physics Letters. Unidade: IME

    Subjects: FÍSICA, ÓPTICA

    PrivadoAcesso à fonteDOIHow to cite
    A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
    • ABNT

      MULATO, Marcelo et al. Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, v. 77, n. 14, p. 2133-2135, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.1314299. Acesso em: 04 nov. 2024.
    • APA

      Mulato, M., Chambouleyron, I. E., Birgin, E. J. G., & Martínez, J. M. (2000). Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, 77( 14), 2133-2135. doi:10.1063/1.1314299
    • NLM

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299
    • Vancouver

      Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299

Digital Library of Intellectual Production of Universidade de São Paulo     2012 - 2024