Source: Applied Physics Letters. Unidade: IME
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MULATO, Marcelo et al. Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, v. 77, n. 14, p. 2133-2135, 2000Tradução . . Disponível em: https://doi.org/10.1063/1.1314299. Acesso em: 04 nov. 2024.APA
Mulato, M., Chambouleyron, I. E., Birgin, E. J. G., & Martínez, J. M. (2000). Determination of thickness and optical constants of amorphous silicon films from transmittance data. Applied Physics Letters, 77( 14), 2133-2135. doi:10.1063/1.1314299NLM
Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299Vancouver
Mulato M, Chambouleyron IE, Birgin EJG, Martínez JM. Determination of thickness and optical constants of amorphous silicon films from transmittance data [Internet]. Applied Physics Letters. 2000 ; 77( 14): 2133-2135.[citado 2024 nov. 04 ] Available from: https://doi.org/10.1063/1.1314299