Source: Surface and Interface Analysis. Unidade: IQSC
ABNT
ANDRESA, Juliana Salvador et al. XPS analysis of eletronic density of iron tetraazamacroycle through Fe 2p binding energies on the 3-imidazolilpropyl-modified surface of oxidized n-Si(100). Surface and Interface Analysis, v. 36, p. 1214-1217, 2004Tradução . . Disponível em: https://doi.org/10.1002/sia.1879. Acesso em: 05 out. 2024.APA
Andresa, J. S., Moreira, L. M., Magalhães, J. L., Gonzalez, E. P., Landers, R., & Rodrigues Filho, U. P. (2004). XPS analysis of eletronic density of iron tetraazamacroycle through Fe 2p binding energies on the 3-imidazolilpropyl-modified surface of oxidized n-Si(100). Surface and Interface Analysis, 36, 1214-1217. doi:10.1002/sia.1879NLM
Andresa JS, Moreira LM, Magalhães JL, Gonzalez EP, Landers R, Rodrigues Filho UP. XPS analysis of eletronic density of iron tetraazamacroycle through Fe 2p binding energies on the 3-imidazolilpropyl-modified surface of oxidized n-Si(100) [Internet]. Surface and Interface Analysis. 2004 ; 36 1214-1217.[citado 2024 out. 05 ] Available from: https://doi.org/10.1002/sia.1879Vancouver
Andresa JS, Moreira LM, Magalhães JL, Gonzalez EP, Landers R, Rodrigues Filho UP. XPS analysis of eletronic density of iron tetraazamacroycle through Fe 2p binding energies on the 3-imidazolilpropyl-modified surface of oxidized n-Si(100) [Internet]. Surface and Interface Analysis. 2004 ; 36 1214-1217.[citado 2024 out. 05 ] Available from: https://doi.org/10.1002/sia.1879