Source: AIP Conference Proceedings. Conference titles: Brazilian Workshop on Nuclear Physics. Unidade: IF
Subjects: FÍSICA NUCLEAR, TOMOGRAFIA COMPUTADORIZADA, ESPECTROSCOPIA DE RAIO GAMA, ESPECTROSCOPIA DE RAIO X, MÉTODO DE MONTE CARLO, DETETORES RADIOATIVOS
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LÓPEZ-PINO, N et al. Monte Carlo semi-empirical model for Si(Li) x-ray detector: differences between nominal and fitted parameters. AIP Conference Proceedings. New York: AIP. Disponível em: http://proceedings.aip.org/resource/2/apcpcs/1529/1/134_1?isAuthorized=no. Acesso em: 01 nov. 2024. , 2013APA
López-Pino, N., Padila-Cabal, F., García-Alvarez, J. A., Vazquez, L., Alessandro, K. D. ', Correa-Alfonso, C. M., et al. (2013). Monte Carlo semi-empirical model for Si(Li) x-ray detector: differences between nominal and fitted parameters. AIP Conference Proceedings. New York: AIP. Recuperado de http://proceedings.aip.org/resource/2/apcpcs/1529/1/134_1?isAuthorized=noNLM
López-Pino N, Padila-Cabal F, García-Alvarez JA, Vazquez L, Alessandro KD', Correa-Alfonso CM, Godoy W, Maidana NL, Vanin VR. Monte Carlo semi-empirical model for Si(Li) x-ray detector: differences between nominal and fitted parameters [Internet]. AIP Conference Proceedings. 2013 ;1529 134-136.[citado 2024 nov. 01 ] Available from: http://proceedings.aip.org/resource/2/apcpcs/1529/1/134_1?isAuthorized=noVancouver
López-Pino N, Padila-Cabal F, García-Alvarez JA, Vazquez L, Alessandro KD', Correa-Alfonso CM, Godoy W, Maidana NL, Vanin VR. Monte Carlo semi-empirical model for Si(Li) x-ray detector: differences between nominal and fitted parameters [Internet]. AIP Conference Proceedings. 2013 ;1529 134-136.[citado 2024 nov. 01 ] Available from: http://proceedings.aip.org/resource/2/apcpcs/1529/1/134_1?isAuthorized=no
