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Filtros : "Kruger, J" Limpar

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Trabalho de evento
Reflection x-ray absorption fine structure study of the passive films on cast and rapidly-solidified mg alloys (1992)
Long, G G; Kruger, J; Tanaka, Deniol Katsuki; Zhang, Z
Source: Proceedings. Conference titles: Symposium on X-Ray Methods in Corrosion and Interfacial Electrochemistry. Unidade: EP
Subjects: METAIS (PROPRIEDADES FÍSICAS), FILMES FINOS, RAIOS X
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
LONG, G G et al. Reflection x-ray absorption fine structure study of the passive films on cast and rapidly-solidified mg alloys. 1992, Anais.. Pennington: Electrochemical Society, 1992. Disponível em: https://repositorio.usp.br/directbitstream/290e758b-800c-4aa9-9196-f126025cf8bd/Tanaka-1992-reflection%20x-ray%20absorption.pdf. Acesso em: 11 out. 2024.
APA
Long, G. G., Kruger, J., Tanaka, D. K., & Zhang, Z. (1992). Reflection x-ray absorption fine structure study of the passive films on cast and rapidly-solidified mg alloys. In Proceedings. Pennington: Electrochemical Society. Recuperado de https://repositorio.usp.br/directbitstream/290e758b-800c-4aa9-9196-f126025cf8bd/Tanaka-1992-reflection%20x-ray%20absorption.pdf
NLM
Long GG, Kruger J, Tanaka DK, Zhang Z. Reflection x-ray absorption fine structure study of the passive films on cast and rapidly-solidified mg alloys [Internet]. Proceedings. 1992 ;[citado 2024 out. 11 ] Available from: https://repositorio.usp.br/directbitstream/290e758b-800c-4aa9-9196-f126025cf8bd/Tanaka-1992-reflection%20x-ray%20absorption.pdf
Vancouver
Long GG, Kruger J, Tanaka DK, Zhang Z. Reflection x-ray absorption fine structure study of the passive films on cast and rapidly-solidified mg alloys [Internet]. Proceedings. 1992 ;[citado 2024 out. 11 ] Available from: https://repositorio.usp.br/directbitstream/290e758b-800c-4aa9-9196-f126025cf8bd/Tanaka-1992-reflection%20x-ray%20absorption.pdf
Artigo de periodico
Surface-extended x-ray-absorption fine structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity (1989)
Long, G G; Fisher, D A; Kruger, J; Black, D P; Tanaka, Deniol Katsuki; Danko, G A
Source: Physical Review B. Condensed Matter. Unidade: EP
Assunto: PROPRIEDADES DOS MATERIAIS
A citação é gerada automaticamente e pode não estar totalmente de acordo com as normas
ABNT
LONG, G G et al. Surface-extended x-ray-absorption fine structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity. Physical Review B. Condensed Matter, v. 39, n. 150, p. 10651-7, 1989Tradução . . Disponível em: https://doi.org/10.1103/physrevb.39.10651. Acesso em: 11 out. 2024.
APA
Long, G. G., Fisher, D. A., Kruger, J., Black, D. P., Tanaka, D. K., & Danko, G. A. (1989). Surface-extended x-ray-absorption fine structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity. Physical Review B. Condensed Matter, 39( 150), 10651-7. doi:10.1103/physrevb.39.10651
NLM
Long GG, Fisher DA, Kruger J, Black DP, Tanaka DK, Danko GA. Surface-extended x-ray-absorption fine structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity [Internet]. Physical Review B. Condensed Matter. 1989 ;39( 150): 10651-7.[citado 2024 out. 11 ] Available from: https://doi.org/10.1103/physrevb.39.10651
Vancouver
Long GG, Fisher DA, Kruger J, Black DP, Tanaka DK, Danko GA. Surface-extended x-ray-absorption fine structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity [Internet]. Physical Review B. Condensed Matter. 1989 ;39( 150): 10651-7.[citado 2024 out. 11 ] Available from: https://doi.org/10.1103/physrevb.39.10651

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