Doped tin oxide nanometric films for environment monitoring (2005)
Hidalgo Falla, Maria del Pilar 
; Peres, Henrique Estanislau Maldonado ; Gouvêa, Douglas ; Ramírez Fernandez, Francisco Javier
Source: Materials Science Forum. Conference titles: International Latin-American Conference on Powder Technology. Unidade: EP
Assunto: NANOTECNOLOGIA
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HIDALGO FALLA, Maria del Pilar et al. Doped tin oxide nanometric films for environment monitoring. Materials Science Forum. Switzerland: Trans Tech Publications. Disponível em: https://doi.org/10.4028/www.scientific.net/MSF.498-499.636. Acesso em: 01 nov. 2024. , 2005APA
Hidalgo Falla, M. del P., Peres, H. E. M., Gouvêa, D., & Ramírez Fernandez, F. J. (2005). Doped tin oxide nanometric films for environment monitoring. Materials Science Forum. Switzerland: Trans Tech Publications. doi:10.4028/www.scientific.net/MSF.498-499.636NLM
Hidalgo Falla M del P, Peres HEM, Gouvêa D, Ramírez Fernandez FJ. Doped tin oxide nanometric films for environment monitoring [Internet]. Materials Science Forum. 2005 ; 489-499 636-641.[citado 2024 nov. 01 ] Available from: https://doi.org/10.4028/www.scientific.net/MSF.498-499.636Vancouver
Hidalgo Falla M del P, Peres HEM, Gouvêa D, Ramírez Fernandez FJ. Doped tin oxide nanometric films for environment monitoring [Internet]. Materials Science Forum. 2005 ; 489-499 636-641.[citado 2024 nov. 01 ] Available from: https://doi.org/10.4028/www.scientific.net/MSF.498-499.636
