Filtros : "Galhiane, Mário Sérgio" "Pizani, Paulo Sérgio" Removido: "Reunião Anual da Sociedade Brasileira de Química" Limpar

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  • Source: Journal of Physics D-Applied Physics. Unidade: IF

    Assunto: FILMES FINOS

    Acesso à fonteHow to cite
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    • ABNT

      PONTES, F M et al. Pressure-induced electrical and structural anomalies in `Pb IND.1-X´`Ca IND.X´`TiO IND.3´ thin films grown at various oxygen pressures by chemical solution route. Journal of Physics D-Applied Physics, v. 41, n. 11, p. 115402/1-115402/8, 2008Tradução . . Disponível em: http://www.iop.org/EJ/article/0022-3727/41/11/115402/d8_11_115402.pdf?request-id=53233735-2601-4714-a8ca-e34cc624732e. Acesso em: 08 nov. 2024.
    • APA

      Pontes, F. M., Galhiane, M. S., Santos, L. S., Rissato, S. R., Pontes, D. S. L., Longo, E., et al. (2008). Pressure-induced electrical and structural anomalies in `Pb IND.1-X´`Ca IND.X´`TiO IND.3´ thin films grown at various oxygen pressures by chemical solution route. Journal of Physics D-Applied Physics, 41( 11), 115402/1-115402/8. Recuperado de http://www.iop.org/EJ/article/0022-3727/41/11/115402/d8_11_115402.pdf?request-id=53233735-2601-4714-a8ca-e34cc624732e
    • NLM

      Pontes FM, Galhiane MS, Santos LS, Rissato SR, Pontes DSL, Longo E, Leite ER, Chiquito AJ, Pizani PS, Jardim RF, Escote MT. Pressure-induced electrical and structural anomalies in `Pb IND.1-X´`Ca IND.X´`TiO IND.3´ thin films grown at various oxygen pressures by chemical solution route [Internet]. Journal of Physics D-Applied Physics. 2008 ; 41( 11): 115402/1-115402/8.[citado 2024 nov. 08 ] Available from: http://www.iop.org/EJ/article/0022-3727/41/11/115402/d8_11_115402.pdf?request-id=53233735-2601-4714-a8ca-e34cc624732e
    • Vancouver

      Pontes FM, Galhiane MS, Santos LS, Rissato SR, Pontes DSL, Longo E, Leite ER, Chiquito AJ, Pizani PS, Jardim RF, Escote MT. Pressure-induced electrical and structural anomalies in `Pb IND.1-X´`Ca IND.X´`TiO IND.3´ thin films grown at various oxygen pressures by chemical solution route [Internet]. Journal of Physics D-Applied Physics. 2008 ; 41( 11): 115402/1-115402/8.[citado 2024 nov. 08 ] Available from: http://www.iop.org/EJ/article/0022-3727/41/11/115402/d8_11_115402.pdf?request-id=53233735-2601-4714-a8ca-e34cc624732e

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