Characterization of anodic silicon oxide films grown in room temperature ionic liquids (2008)
Source: Electrochimica Acta. Unidade: IQ
Subjects: LÍQUIDOS IÔNICOS, ELETROQUÍMICA
ABNT
FIORITO, Pablo Alejandro et al. Characterization of anodic silicon oxide films grown in room temperature ionic liquids. Electrochimica Acta, v. 53, n. 25, p. 7396-7402, 2008Tradução . . Disponível em: https://doi.org/10.1016/j.electacta.2007.11.048. Acesso em: 26 jun. 2025.APA
Fiorito, P. A., Alves, W. A., Bazito, F. F. C., EL Haber, F., Froyer, G., Torresi, S. I. C. de, & Torresi, R. M. (2008). Characterization of anodic silicon oxide films grown in room temperature ionic liquids. Electrochimica Acta, 53( 25), 7396-7402. doi:10.1016/j.electacta.2007.11.048NLM
Fiorito PA, Alves WA, Bazito FFC, EL Haber F, Froyer G, Torresi SIC de, Torresi RM. Characterization of anodic silicon oxide films grown in room temperature ionic liquids [Internet]. Electrochimica Acta. 2008 ; 53( 25): 7396-7402.[citado 2025 jun. 26 ] Available from: https://doi.org/10.1016/j.electacta.2007.11.048Vancouver
Fiorito PA, Alves WA, Bazito FFC, EL Haber F, Froyer G, Torresi SIC de, Torresi RM. Characterization of anodic silicon oxide films grown in room temperature ionic liquids [Internet]. Electrochimica Acta. 2008 ; 53( 25): 7396-7402.[citado 2025 jun. 26 ] Available from: https://doi.org/10.1016/j.electacta.2007.11.048