Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si (2002)
Fonte: Microelectronics Journal. Unidade: IF
Assunto: FOTOLUMINESCÊNCIA
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ABNT
ARAUJO, C. Moyses et al. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si. Microelectronics Journal, v. 33, n. 4, p. 365-369, 2002Tradução . . Disponível em: https://doi.org/10.1016/s0026-2692(01)00133-1. Acesso em: 23 ago. 2024.APA
Araujo, C. M., Fernandez, J. R. L., Silva, A. F. da, Pepe, I., Leite, J. R., Sernelius, B. E., et al. (2002). Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si. Microelectronics Journal, 33( 4), 365-369. doi:10.1016/s0026-2692(01)00133-1NLM
Araujo CM, Fernandez JRL, Silva AF da, Pepe I, Leite JR, Sernelius BE, Tabata A, Persson C, Ahuja R, As DJ, Schikora D, Lischka K. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si [Internet]. Microelectronics Journal. 2002 ; 33( 4): 365-369.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1016/s0026-2692(01)00133-1Vancouver
Araujo CM, Fernandez JRL, Silva AF da, Pepe I, Leite JR, Sernelius BE, Tabata A, Persson C, Ahuja R, As DJ, Schikora D, Lischka K. Electrical resistivity, MNM transition and band-gap narrowing of cubic GaN: Si [Internet]. Microelectronics Journal. 2002 ; 33( 4): 365-369.[citado 2024 ago. 23 ] Available from: https://doi.org/10.1016/s0026-2692(01)00133-1
