Thickness estimation of TiO2-Based nanotubes using X-Ray diffraction techniques (2020)
Faria, Marcela E. M; Leite, Marina Moraes 
; Ichikawa, Rodrigo Uchida ; Vichi, Flávio Maron ; Turrillas, X; Martinez, L G
Source: Materials Science Forum. Unidade: IQ
Subjects: NANOTUBOS, DIFRAÇÃO POR RAIOS X
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FARIA, Marcela E. M et al. Thickness estimation of TiO2-Based nanotubes using X-Ray diffraction techniques. Materials Science Forum, v. 1012, p. 179-184, 2020Tradução . . Disponível em: https://doi.org/10.4028/www.scientific.net/MSF.1012.179. Acesso em: 15 nov. 2024.APA
Faria, M. E. M., Leite, M. M., Ichikawa, R. U., Vichi, F. M., Turrillas, X., & Martinez, L. G. (2020). Thickness estimation of TiO2-Based nanotubes using X-Ray diffraction techniques. Materials Science Forum, 1012, 179-184. doi:10.4028/www.scientific.net/MSF.1012.179NLM
Faria MEM, Leite MM, Ichikawa RU, Vichi FM, Turrillas X, Martinez LG. Thickness estimation of TiO2-Based nanotubes using X-Ray diffraction techniques [Internet]. Materials Science Forum. 2020 ; 1012 179-184.[citado 2024 nov. 15 ] Available from: https://doi.org/10.4028/www.scientific.net/MSF.1012.179Vancouver
Faria MEM, Leite MM, Ichikawa RU, Vichi FM, Turrillas X, Martinez LG. Thickness estimation of TiO2-Based nanotubes using X-Ray diffraction techniques [Internet]. Materials Science Forum. 2020 ; 1012 179-184.[citado 2024 nov. 15 ] Available from: https://doi.org/10.4028/www.scientific.net/MSF.1012.179
